Structural, syntactic, and statistical pattern recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings - Bai, Xiao; Hancock, Edwin R. 1956-; Ho, Tin Kam; Wilson, Richard C.; Biggio, Battista; Robles-Kelly, Antonio (Springer, 2018)
Keywords: Artificial Intelligence (incl. Robotics); Pattern Recognition; Image Processing and Computer Vision; Algorithm Analysis and Problem Complexity; Discrete Mathematics in Computer Science; Data Structures; Artificial intelligence; Optical pattern recognition; Computer vision; Computer software; Computational complexity; Data structures (Computer scienc; Struktur; Syntax; Informatik; Mustererkennung; Statistik; Konferenzschrift -- 2018 -- Peking