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Main Authors: | , , , |
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Format: | Electronic eBook |
Language: | English |
Published: |
Boston, MA
Springer US
2002
|
Subjects: | |
Links: | https://doi.org/10.1007/b117332 https://doi.org/10.1007/b117332 https://doi.org/10.1007/b117332 |
Summary: | Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students |
Physical Description: | 1 Online-Ressource (XXIII, 210 p. 36 illus) |
ISBN: | 9780306470240 |
DOI: | 10.1007/b117332 |
Staff View
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Record in the Search Index
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discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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id | DE-604.BV045148428 |
illustrated | Not Illustrated |
indexdate | 2024-12-20T18:19:18Z |
institution | BVB |
isbn | 9780306470240 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538127 |
oclc_num | 1050951609 |
open_access_boolean | |
owner | DE-573 DE-634 |
owner_facet | DE-573 DE-634 |
physical | 1 Online-Ressource (XXIII, 210 p. 36 illus) |
psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv |
publishDate | 2002 |
publishDateSearch | 2002 |
publishDateSort | 2002 |
publisher | Springer US |
record_format | marc |
spelling | Cheng, Yi-Kan Verfasser aut Electrothermal Analysis of VLSI Systems by Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo Steve Kang Boston, MA Springer US 2002 1 Online-Ressource (XXIII, 210 p. 36 illus) txt rdacontent c rdamedia cr rdacarrier Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Tsai, Ching-Han aut Teng, Chin-Chi aut Kang, Sung-Mo Steve aut Erscheint auch als Druck-Ausgabe 9780792378617 https://doi.org/10.1007/b117332 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Cheng, Yi-Kan Tsai, Ching-Han Teng, Chin-Chi Kang, Sung-Mo Steve Electrothermal Analysis of VLSI Systems Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
title | Electrothermal Analysis of VLSI Systems |
title_auth | Electrothermal Analysis of VLSI Systems |
title_exact_search | Electrothermal Analysis of VLSI Systems |
title_full | Electrothermal Analysis of VLSI Systems by Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo Steve Kang |
title_fullStr | Electrothermal Analysis of VLSI Systems by Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo Steve Kang |
title_full_unstemmed | Electrothermal Analysis of VLSI Systems by Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo Steve Kang |
title_short | Electrothermal Analysis of VLSI Systems |
title_sort | electrothermal analysis of vlsi systems |
topic | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
topic_facet | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
url | https://doi.org/10.1007/b117332 |
work_keys_str_mv | AT chengyikan electrothermalanalysisofvlsisystems AT tsaichinghan electrothermalanalysisofvlsisystems AT tengchinchi electrothermalanalysisofvlsisystems AT kangsungmosteve electrothermalanalysisofvlsisystems |