Scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
| Beteiligte Personen: | , , , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
New York
Springer
[2018]
|
| Ausgabe: | Forth edition |
| Schlagwörter: | |
| Links: | https://doi.org/10.1007/978-1-4939-6676-9 https://doi.org/10.1007/978-1-4939-6676-9 https://ebookcentral.proquest.com/lib/ub-lmu/detail.action?docID=6314883 https://doi.org/10.1007/978-1-4939-6676-9 |
| Umfang: | 1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig) |
| ISBN: | 9781493966769 |
| DOI: | 10.1007/978-1-4939-6676-9 |
Internformat
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| author | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- |
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| discipline | Chemie / Pharmazie Physik Medizin |
| doi_str_mv | 10.1007/978-1-4939-6676-9 |
| edition | Forth edition |
| format | Electronic eBook |
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| id | DE-604.BV044703143 |
| illustrated | Illustrated |
| indexdate | 2025-01-11T19:19:38Z |
| institution | BVB |
| isbn | 9781493966769 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030099815 |
| oclc_num | 1018460912 |
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| owner_facet | DE-634 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-11 DE-83 |
| physical | 1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig) |
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| publishDate | 2018 |
| publishDateSearch | 2018 |
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| publisher | Springer |
| record_format | marc |
| spellingShingle | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- Scanning electron microscopy and x-ray microanalysis Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4065579-9 (DE-588)4151898-6 (DE-588)4320991-9 (DE-588)4048455-5 |
| title | Scanning electron microscopy and x-ray microanalysis |
| title_auth | Scanning electron microscopy and x-ray microanalysis |
| title_exact_search | Scanning electron microscopy and x-ray microanalysis |
| title_full | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| title_fullStr | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| title_short | Scanning electron microscopy and x-ray microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis |
| topic | Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie |
| url | https://doi.org/10.1007/978-1-4939-6676-9 |
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