Verfügbarkeit: Conductive atomic force microscopy | Technische Universität München

Conductive atomic force microscopy: applications in nanomaterials

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Bibliographische Detailangaben
Weitere beteiligte Personen:	Lanza, Mario (HerausgeberIn)
Format:	Elektronisch E-Book
Sprache:	Englisch
Veröffentlicht:	Chichester, West Sussex Wiley [2017]
Schlagwörter:	Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit Rasterkraftmikroskopie Aufsatzsammlung
Links:	https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773
Umfang:	1 Online-Ressource (250 p.)
ISBN:	9783527699773 9783527699780

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spelling	Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza Chichester, West Sussex Wiley [2017] 1 Online-Ressource (250 p.) txt rdacontent c rdamedia cr rdacarrier Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit (DE-588)4014200-0 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Elektrische Leitfähigkeit (DE-588)4014200-0 s Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Lanza, Mario edt Erscheint auch als Druck-Ausgabe 9783527340910 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773 Verlag URL des Erstveröffentlichers Volltext
spellingShingle	Conductive atomic force microscopy applications in nanomaterials Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit (DE-588)4014200-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd
subject_GND	(DE-588)4014200-0 (DE-588)4274473-8 (DE-588)4143413-4
title	Conductive atomic force microscopy applications in nanomaterials
title_auth	Conductive atomic force microscopy applications in nanomaterials
title_exact_search	Conductive atomic force microscopy applications in nanomaterials
title_full	Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza
title_fullStr	Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza
title_full_unstemmed	Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza
title_short	Conductive atomic force microscopy
title_sort	conductive atomic force microscopy applications in nanomaterials
title_sub	applications in nanomaterials
topic	Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit (DE-588)4014200-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd
topic_facet	Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit Rasterkraftmikroskopie Aufsatzsammlung
url	https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773
work_keys_str_mv	AT lanzamario conductiveatomicforcemicroscopyapplicationsinnanomaterials

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