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X-ray and image analysis in electron microscopy:

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Bibliographic Details
Main Authors:	Friel, John J. (Author), Terborg, Ralf 1969- (Author), Langner, Stefan (Author), Salge, Tobias (Author), Rohde, Martin (Author), Berlin, Jana (Author)
Format:	Book
Language:	English
Published:	Berlin Pro Business 2017
Edition:	3rd edition
Subjects:	Elektronenstrahlmikroanalyse Elektronenmikroskop SDD chemical microanalysis microprobe nanoanalysis nanoscience spectrometry
Links:	http://d-nb.info/1130268055/04 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029890228&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
Physical Description:	118 Seiten Illustrationen, Diagramme 29 cm, 580 g 1 ungezähltes Blatt
ISBN:	9783864606748 3864606748

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MARC


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Record in the Search Index

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adam_text	TABLE OF CONTENTS I. INTRODUCTION 10 OTHER MICROANALYTICAL TECHNIQUES 10 BRIEF HISTORY 12 II. ELECTRON-SPECIMEN INTERACTION AND X-RAY GENERATION 14 ELECTRON SCATTERING 14 IONIZATION CROSS SECTION 14 CHARACTERISTIC X-RAYS 15 MOSELEY S LAW 16 FLUORESCENCE YIELD 18 RELATIVE LINE INTENSITIES 18 CONTINUUM GENERATION 20 ABSORPTION 21 FLUORESCENCE 23 III. X-RAY MEASUREMENT 24 ENERGY DISPERSIVE SPECTROSCOPY 24 GENERAL D ESCRIPTION 24 TYPES OF EDS D ETECTORS 24 LITHIUM -DRIFTED SILICON 24 SILICON D RIFT D ETECTOR 26 M ICROCALORIM ETER 28 D ETECTOR COM PARISON 29 XFIASHFLAT Q UAD 29 SIGNAL PROCESSING 30 ANALOG SIGNAL PROCESSING 30 DIGITAL PROCESSING 30 HYBRID SIGNAL PROCESSING 32 D ETECTOR RESOLUTION 32 C OUNT RATE VS. RESOLUTION 34 Q UANTUM EFFICIENCY 34 C OLLECTION EFFICIENCY 35 SOLID A NGLE 35 SPECTRAL A RTIFACTS 36 WAVELENGTH DISPERSIVE SPECTROSCOPY 36 GENERAL D ESCRIPTION 36 S PECTROM ETER RESOLUTION 39 COMPARISON OF DETECTION TECHNIQUES 39 SPATIAL RESOLUTION 40 RANGE IN O THER INSTRUM ENTS 42 IV. QUALITATIVE ANALYSIS 44 CALIBRATION 44 AUTOMATIC IDENTIFICATION 44 STEP-BY-STEP IDENTIFICATION 45 OVERLAPS 46 SUMMARY OF QUALITATIVE ANALYSIS 46 V. QUANTITATIVE ANALYSIS 47 BACKGROUND SUBTRACTION AND DECONVOLUTION 47 BACKGROUND SUBTRACTION 47 D ECONVOLUTION 48 TAKE-OFF A NGLE 50 VARIABLE Z 51 STANDARDLESS ANALYSIS 52 S PECTROM ETER EFFICIENCY 52 MATRIX CORRECTION 53 CALIBRATION C URVES 54 ZAF M ETHOD 54 A TOM IC N UM BER C ORRECTION 54 A BSORPTION C ORRECTION 55 FLUORESCENCE C ORRECTION 56 PHI-RHO-Z M ETHOD 57 C OM PARISON OF ZAF VS. PHI-RHO-Z M ETHODS 58 BENCE-ALBEE M ETHOD 59 S UM M ARY OF M ATRIX C ORRECTIONS 59 R EQUIREM ENTS FOR Q UANTITATIVE ANALYSIS 60 LIGHT E LEM ENT ANALYSIS 61 THIN FILM ANALYSIS 62 BIOLOGICAL M ICROANALYSIS 62 M ONTE CARLO C ALCULATIONS 62 VI. PRECISION AND ACCURACY 64 DEFINITIONS 64 PRECISION 65 A BSOLUTE PRECISION 65 RELATIVE PRECISION 65 M INIM UM D ETECTABILITY LIM IT 65 PRECISION OF SILICON D RIFT D ETECTORS 66 PRECISION OF LIGHT E LEM ENT D ETECTORS 66 ACCURACY 66 SUMMARY OF PRECISION AND ACCURACY 67 VII. OPERATING CONDITIONS IN THE MICROSCOPE 68 ACCELERATING VOLTAGE 68 ELECTRON BEAM CURRENT 68 C ONTRAST 68 RESOLUTION 69 SUMMARY OF OPERATIONS 70 VIII. DIGITAL IMAGING: PROCESSING AND IMAGE MATH 71 CAPTURING THE PERFECT IMAGE 71 PIXEL SIZE AND R ESOLUTION 72 G RAYSCALE AND COLOR 73 FILE-TYPES AND C OM PRESSION 74 IMAGE PROCESSING 74 O PERATIONS PERFORM ED ON O RIGINAL (COLOR OR GRAYSCALE) IM AGES 74 C O NTRAST/B RIGHTNESS (H ISTOGRAM ) TRANSFORM S 74 G AM M A CORRECTION 75 KERNEL PROCESSING (E.G. SM OOTHING, SHARPENING, EDGE FINDING,...) 76 B INARIZATION/THRESHOLDING 77 O PERATIONS PERFORM ED ON BINARY IM AGES 77 EROSION AND DILATION 77 PARTICLE C UTTING AND HOLE FILLING 77 IMAGE COMPARISON / IMAGE MATH 78 SUMMARY OF DIGITAL IMAGING, PROCESSING AND IMAGE MATH 78 IX. IMAGE AND FEATURE ANALYSIS 79 IMAGE SEGMENTATION/AREA FRACTION 79 FEATURE ANALYSIS 79 M ORPHOLOGICAL C HARACTERIZATION 79 CHEM ICAL C LASSIFICATION (W ITH EDS) 84 TYPICAL W ORKFLOW AND O UTPUT O BTAINED BY FEATURE ANALYSIS W ITH EDS 84 STANDARD METHODS 87 SUMMARY OF IMAGE AND FEATURE ANALYSIS 87 X. X-RAY MAPS AND LINE SCANS 88 ADVANCES IN X-RAY MAPPING TECHNIQUES 88 CONVENTIONAL X-RAY M AP 88 M ODERN H YPERSPECTRAL IM AGING (HYPERM AP) 89 M AXIM UM PIXEL SPECTRUM 93 BACKGROUND S UBTRACTION IN ELEM ENT M APS 95 Q UANTITATIVE M AP (Q M AP) 97 CHEM ICAL PHASE ANALYSIS (AUTOPHASE) 98 LINE SCANS VS. X-RAY MAPS 100 SUMMARY 102 XL APPLICATION EXAMPLES 103 POLYM ER ANALYSIS 104 Q UANTIFICATION OF BORON 106 M APPING BORON W ITH ED S /S E M 107 D ETECTING M INOR AND TRACE ELEM ENTS IN CR-NI STEEL 108 D ISTINGUISHING B ETW EEN H EM ATITE (FE20 3) AND M AGNETITE (FE30 4) 109 W HEN THE SAM PLE REQUIRES A LOW ACCELERATING VOLTAGE 110 D ECONVOLUTION OF STRONGLY OVERLAPPING PEAKS 111 ROUTINE S UB-N ANOM ETER RESOLUTION M APPING W ITH S TE M /E D S 112 EDS ANALYSIS IN STEM 113 REFERENCES 114 INDEX 116
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author	Friel, John J. Terborg, Ralf 1969- Langner, Stefan Salge, Tobias Rohde, Martin Berlin, Jana
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author_facet	Friel, John J. Terborg, Ralf 1969- Langner, Stefan Salge, Tobias Rohde, Martin Berlin, Jana
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dewey-sort	3502.825
dewey-tens	500 - Natural sciences and mathematics 530 - Physics
discipline	Allgemeine Naturwissenschaft Physik
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physical	118 Seiten Illustrationen, Diagramme 29 cm, 580 g 1 ungezähltes Blatt
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spellingShingle	Friel, John J. Terborg, Ralf 1969- Langner, Stefan Salge, Tobias Rohde, Martin Berlin, Jana X-ray and image analysis in electron microscopy Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenmikroskop (DE-588)4014326-0 gnd
subject_GND	(DE-588)4151898-6 (DE-588)4014326-0
title	X-ray and image analysis in electron microscopy
title_auth	X-ray and image analysis in electron microscopy
title_exact_search	X-ray and image analysis in electron microscopy
title_full	X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz)
title_fullStr	X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz)
title_full_unstemmed	X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz)
title_short	X-ray and image analysis in electron microscopy
title_sort	x ray and image analysis in electron microscopy
topic	Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenmikroskop (DE-588)4014326-0 gnd
topic_facet	Elektronenstrahlmikroanalyse Elektronenmikroskop
url	http://d-nb.info/1130268055/04 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029890228&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
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