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Bibliographic Details
Other Authors:	Ma, Zhiyong (Editor), Seiler, David G. (Editor)
Format:	Book
Language:	English
Published:	Singapore Pan Stanford Publishing [2017]
Subjects:	Nanoelectronics Metrology
Physical Description:	xli, 1411 Seiten Illustrationen, Diagramme 24 cm
ISBN:	9814745081 9789814745086

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Record in the Search Index

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physical	xli, 1411 Seiten Illustrationen, Diagramme 24 cm
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spelling	Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler Singapore Pan Stanford Publishing [2017] © 2017 xli, 1411 Seiten Illustrationen, Diagramme 24 cm txt rdacontent n rdamedia nc rdacarrier Nanoelectronics Metrology Ma, Zhiyong edt Seiler, David G. edt
spellingShingle	Metrology and diagnostic techniques for nanoelectronics
title	Metrology and diagnostic techniques for nanoelectronics
title_auth	Metrology and diagnostic techniques for nanoelectronics
title_exact_search	Metrology and diagnostic techniques for nanoelectronics
title_full	Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler
title_fullStr	Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler
title_full_unstemmed	Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler
title_short	Metrology and diagnostic techniques for nanoelectronics
title_sort	metrology and diagnostic techniques for nanoelectronics
work_keys_str_mv	AT mazhiyong metrologyanddiagnostictechniquesfornanoelectronics AT seilerdavidg metrologyanddiagnostictechniquesfornanoelectronics

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