APA (7th ed.) Citation

Ma, Z., & Seiler, D. G. (2017). Metrology and diagnostic techniques for nanoelectronics. Pan Stanford Publishing.

Chicago Style (17th ed.) Citation

Ma, Zhiyong, and David G. Seiler. Metrology and Diagnostic Techniques for Nanoelectronics. Singapore: Pan Stanford Publishing, 2017.

MLA (9th ed.) Citation

Ma, Zhiyong, and David G. Seiler. Metrology and Diagnostic Techniques for Nanoelectronics. Pan Stanford Publishing, 2017.

Warning: These citations may not always be 100% accurate.