APA-Zitierstil (7. Ausg.)

Ma, Z., & Seiler, D. G. (2017). Metrology and diagnostic techniques for nanoelectronics. Pan Stanford Publishing.

Chicago-Zitierstil (17. Ausg.)

Ma, Zhiyong, und David G. Seiler. Metrology and Diagnostic Techniques for Nanoelectronics. Singapore: Pan Stanford Publishing, 2017.

MLA-Zitierstil (9. Ausg.)

Ma, Zhiyong, und David G. Seiler. Metrology and Diagnostic Techniques for Nanoelectronics. Pan Stanford Publishing, 2017.