Monte Carlo modeling for electron microscopy and microanalysis:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York
Oxford University Press
1995
|
| Series: | Oxford series in optical and imaging sciences
9 |
| Subjects: | |
| Item Description: | Includes bibliographical references |
| Physical Description: | viii, 216 p. |
| ISBN: | 0195088743 9780195088748 |
Staff View
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044135405 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s1995 xx o|||| 00||| eng d | ||
| 020 | |a 0195088743 |c acidfree paper |9 0-19-508874-3 | ||
| 020 | |a 9780195088748 |9 978-0-19-508874-8 | ||
| 035 | |a (ZDB-30-PAD)EBC430981 | ||
| 035 | |a (ZDB-89-EBL)EBL430981 | ||
| 035 | |a (OCoLC)435816746 | ||
| 035 | |a (DE-599)BVBBV044135405 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 502/.8/25 |2 20 | |
| 100 | 1 | |a Joy, David C. |d 1943- |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Monte Carlo modeling for electron microscopy and microanalysis |c David C. Joy |
| 264 | 1 | |a New York |b Oxford University Press |c 1995 | |
| 300 | |a viii, 216 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Oxford series in optical and imaging sciences |v 9 | |
| 500 | |a Includes bibliographical references | ||
| 650 | 4 | |a Electron microscopy |x Computer simulation | |
| 650 | 4 | |a Electron probe microanalysis |x Computer simulation | |
| 650 | 4 | |a Monte Carlo method | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 0 | 1 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 1 | 1 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 912 | |a ZDB-30-PAD | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029542250 | |
Record in the Search Index
| _version_ | 1818982921043705856 |
|---|---|
| any_adam_object | |
| author | Joy, David C. 1943- |
| author_facet | Joy, David C. 1943- |
| author_role | aut |
| author_sort | Joy, David C. 1943- |
| author_variant | d c j dc dcj |
| building | Verbundindex |
| bvnumber | BV044135405 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC430981 (ZDB-89-EBL)EBL430981 (OCoLC)435816746 (DE-599)BVBBV044135405 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01895nam a2200493zcb4500</leader><controlfield tag="001">BV044135405</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s1995 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0195088743</subfield><subfield code="c">acidfree paper</subfield><subfield code="9">0-19-508874-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780195088748</subfield><subfield code="9">978-0-19-508874-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC430981</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL430981</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)435816746</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044135405</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">20</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Joy, David C.</subfield><subfield code="d">1943-</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Monte Carlo modeling for electron microscopy and microanalysis</subfield><subfield code="c">David C. Joy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Oxford University Press</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">viii, 216 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Oxford series in optical and imaging sciences</subfield><subfield code="v">9</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Computer simulation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron probe microanalysis</subfield><subfield code="x">Computer simulation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Monte Carlo method</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029542250</subfield></datafield></record></collection> |
| id | DE-604.BV044135405 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:54:53Z |
| institution | BVB |
| isbn | 0195088743 9780195088748 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029542250 |
| oclc_num | 435816746 |
| open_access_boolean | |
| physical | viii, 216 p. |
| psigel | ZDB-30-PAD |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Oxford University Press |
| record_format | marc |
| series2 | Oxford series in optical and imaging sciences |
| spelling | Joy, David C. 1943- Verfasser aut Monte Carlo modeling for electron microscopy and microanalysis David C. Joy New York Oxford University Press 1995 viii, 216 p. txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 9 Includes bibliographical references Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Monte-Carlo-Simulation (DE-588)4240945-7 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Monte-Carlo-Simulation (DE-588)4240945-7 s 1\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 2\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Joy, David C. 1943- Monte Carlo modeling for electron microscopy and microanalysis Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4240945-7 (DE-588)4151898-6 |
| title | Monte Carlo modeling for electron microscopy and microanalysis |
| title_auth | Monte Carlo modeling for electron microscopy and microanalysis |
| title_exact_search | Monte Carlo modeling for electron microscopy and microanalysis |
| title_full | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_fullStr | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_full_unstemmed | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_short | Monte Carlo modeling for electron microscopy and microanalysis |
| title_sort | monte carlo modeling for electron microscopy and microanalysis |
| topic | Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie Monte-Carlo-Simulation Elektronenstrahlmikroanalyse |
| work_keys_str_mv | AT joydavidc montecarlomodelingforelectronmicroscopyandmicroanalysis |