Gespeichert in:
Bibliographische Detailangaben
Beteiligte Personen: Huang, Songling (VerfasserIn), Zhao, Wei (VerfasserIn)
Format: Elektronisch E-Book
Sprache:Englisch
Veröffentlicht: Berlin ; Boston De Gruyter [2016]
Schriftenreihe:Advances in Electrical and Electronic Engineering
Schlagwörter:
Links:https://www.degruyter.com/doi/book/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://doi.org/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://doi.org/10.1515/9783110480153
https://doi.org/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://www.degruyter.com/doi/book/10.1515/9783110480153
https://doi.org/10.1515/9783110480153
Zusammenfassung:This book systematically introduces magnetic flux leakage testing principles and their applications in practice. Signal detection, collection, processing, the inversion of magnetic flux leakage defect and 3D imaging are discussed in detail with extensive project experiences, making the book an essential reference for researchers, developers and engineers in nondestructive testing
Beschreibung:Description based on online resource; title from PDF title page (publisher's Web site, viewed Nov. 7, 2016)
Umfang:1 Online-Ressource (242 Seiten)
ISBN:9783110480153
9783110479713
DOI:10.1515/9783110480153