Integrated imaging and vision techniques for industrial inspection: advances and applications
Gespeichert in:
| Weitere beteiligte Personen: | , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
London ; Heidelberg ; New York ; Dordrecht
Springer
[2015]
|
| Schriftenreihe: | Advances in computer vision and pattern recognition
|
| Schlagwörter: | |
| Umfang: | x, 541 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 1447167406 9781447167402 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV043192785 | ||
| 003 | DE-604 | ||
| 005 | 20160425 | ||
| 007 | t| | ||
| 008 | 151208s2015 xx a||| |||| 00||| eng d | ||
| 016 | 7 | |a 1072311518 |2 DE-101 | |
| 020 | |a 1447167406 |9 1-4471-6740-6 | ||
| 020 | |a 9781447167402 |c hbk. |9 978-1-4471-6740-2 | ||
| 035 | |a (OCoLC)969768811 | ||
| 035 | |a (DE-599)DNB1072311518 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 | ||
| 084 | |a ST 308 |0 (DE-625)143655: |2 rvk | ||
| 084 | |a ST 610 |0 (DE-625)143683: |2 rvk | ||
| 245 | 1 | 0 | |a Integrated imaging and vision techniques for industrial inspection |b advances and applications |c Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors |
| 264 | 1 | |a London ; Heidelberg ; New York ; Dordrecht |b Springer |c [2015] | |
| 264 | 4 | |c © 2015 | |
| 300 | |a x, 541 Seiten |b Illustrationen, Diagramme (teilweise farbig) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Advances in computer vision and pattern recognition | |
| 505 | 8 | |a Literaturangaben | |
| 650 | 0 | 7 | |a Systemintegration |0 (DE-588)4464875-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mustererkennung |0 (DE-588)4040936-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Bildverarbeitung |0 (DE-588)4006684-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Inspektion |0 (DE-588)4461772-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Maschinelles Sehen |0 (DE-588)4129594-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Inspektion |0 (DE-588)4461772-0 |D s |
| 689 | 0 | 1 | |a Bildverarbeitung |0 (DE-588)4006684-8 |D s |
| 689 | 0 | 2 | |a Maschinelles Sehen |0 (DE-588)4129594-8 |D s |
| 689 | 0 | 3 | |a Mustererkennung |0 (DE-588)4040936-3 |D s |
| 689 | 0 | 4 | |a Systemintegration |0 (DE-588)4464875-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Liu, Zheng |d 1956- |0 (DE-588)171596242 |4 edt | |
| 700 | 1 | |a Ukida, Hiroyuki |d 1969- |0 (DE-588)1098174259 |4 edt | |
| 700 | 1 | |a Ramuhalli, Pradeep |e Sonstige |4 oth | |
| 700 | 1 | |a Niel, Kurt |e Sonstige |4 oth | |
| 710 | 2 | |a Springer-Verlag London Ltd. |0 (DE-588)1065358059 |4 pbl | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-1-4471-6741-9 |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-028616375 | |
Datensatz im Suchindex
| _version_ | 1825638372621680640 |
|---|---|
| adam_text | |
| any_adam_object | |
| author2 | Liu, Zheng 1956- Ukida, Hiroyuki 1969- |
| author2_role | edt edt |
| author2_variant | z l zl h u hu |
| author_GND | (DE-588)171596242 (DE-588)1098174259 |
| author_facet | Liu, Zheng 1956- Ukida, Hiroyuki 1969- |
| building | Verbundindex |
| bvnumber | BV043192785 |
| classification_rvk | ST 308 ST 610 |
| contents | Literaturangaben |
| ctrlnum | (OCoLC)969768811 (DE-599)DNB1072311518 |
| discipline | Informatik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV043192785</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160425</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">151208s2015 xx a||| |||| 00||| eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1072311518</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1447167406</subfield><subfield code="9">1-4471-6740-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781447167402</subfield><subfield code="c">hbk.</subfield><subfield code="9">978-1-4471-6740-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)969768811</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB1072311518</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 308</subfield><subfield code="0">(DE-625)143655:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 610</subfield><subfield code="0">(DE-625)143683:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Integrated imaging and vision techniques for industrial inspection</subfield><subfield code="b">advances and applications</subfield><subfield code="c">Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London ; Heidelberg ; New York ; Dordrecht</subfield><subfield code="b">Springer</subfield><subfield code="c">[2015]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">x, 541 Seiten</subfield><subfield code="b">Illustrationen, Diagramme (teilweise farbig)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advances in computer vision and pattern recognition</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Systemintegration</subfield><subfield code="0">(DE-588)4464875-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bildverarbeitung</subfield><subfield code="0">(DE-588)4006684-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Inspektion</subfield><subfield code="0">(DE-588)4461772-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Inspektion</subfield><subfield code="0">(DE-588)4461772-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Bildverarbeitung</subfield><subfield code="0">(DE-588)4006684-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Systemintegration</subfield><subfield code="0">(DE-588)4464875-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Zheng</subfield><subfield code="d">1956-</subfield><subfield code="0">(DE-588)171596242</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ukida, Hiroyuki</subfield><subfield code="d">1969-</subfield><subfield code="0">(DE-588)1098174259</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ramuhalli, Pradeep</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Niel, Kurt</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Springer-Verlag London Ltd.</subfield><subfield code="0">(DE-588)1065358059</subfield><subfield code="4">pbl</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-1-4471-6741-9</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028616375</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV043192785 |
| illustrated | Illustrated |
| indexdate | 2025-03-04T05:00:26Z |
| institution | BVB |
| institution_GND | (DE-588)1065358059 |
| isbn | 1447167406 9781447167402 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028616375 |
| oclc_num | 969768811 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | x, 541 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Springer |
| record_format | marc |
| series2 | Advances in computer vision and pattern recognition |
| spelling | Integrated imaging and vision techniques for industrial inspection advances and applications Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors London ; Heidelberg ; New York ; Dordrecht Springer [2015] © 2015 x, 541 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Advances in computer vision and pattern recognition Literaturangaben Systemintegration (DE-588)4464875-3 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf Bildverarbeitung (DE-588)4006684-8 gnd rswk-swf Inspektion (DE-588)4461772-0 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content Inspektion (DE-588)4461772-0 s Bildverarbeitung (DE-588)4006684-8 s Maschinelles Sehen (DE-588)4129594-8 s Mustererkennung (DE-588)4040936-3 s Systemintegration (DE-588)4464875-3 s DE-604 Liu, Zheng 1956- (DE-588)171596242 edt Ukida, Hiroyuki 1969- (DE-588)1098174259 edt Ramuhalli, Pradeep Sonstige oth Niel, Kurt Sonstige oth Springer-Verlag London Ltd. (DE-588)1065358059 pbl Erscheint auch als Online-Ausgabe 978-1-4471-6741-9 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Integrated imaging and vision techniques for industrial inspection advances and applications Literaturangaben Systemintegration (DE-588)4464875-3 gnd Mustererkennung (DE-588)4040936-3 gnd Bildverarbeitung (DE-588)4006684-8 gnd Inspektion (DE-588)4461772-0 gnd Maschinelles Sehen (DE-588)4129594-8 gnd |
| subject_GND | (DE-588)4464875-3 (DE-588)4040936-3 (DE-588)4006684-8 (DE-588)4461772-0 (DE-588)4129594-8 (DE-588)4143413-4 |
| title | Integrated imaging and vision techniques for industrial inspection advances and applications |
| title_auth | Integrated imaging and vision techniques for industrial inspection advances and applications |
| title_exact_search | Integrated imaging and vision techniques for industrial inspection advances and applications |
| title_full | Integrated imaging and vision techniques for industrial inspection advances and applications Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors |
| title_fullStr | Integrated imaging and vision techniques for industrial inspection advances and applications Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors |
| title_full_unstemmed | Integrated imaging and vision techniques for industrial inspection advances and applications Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors |
| title_short | Integrated imaging and vision techniques for industrial inspection |
| title_sort | integrated imaging and vision techniques for industrial inspection advances and applications |
| title_sub | advances and applications |
| topic | Systemintegration (DE-588)4464875-3 gnd Mustererkennung (DE-588)4040936-3 gnd Bildverarbeitung (DE-588)4006684-8 gnd Inspektion (DE-588)4461772-0 gnd Maschinelles Sehen (DE-588)4129594-8 gnd |
| topic_facet | Systemintegration Mustererkennung Bildverarbeitung Inspektion Maschinelles Sehen Aufsatzsammlung |
| work_keys_str_mv | AT liuzheng integratedimagingandvisiontechniquesforindustrialinspectionadvancesandapplications AT ukidahiroyuki integratedimagingandvisiontechniquesforindustrialinspectionadvancesandapplications AT ramuhallipradeep integratedimagingandvisiontechniquesforindustrialinspectionadvancesandapplications AT nielkurt integratedimagingandvisiontechniquesforindustrialinspectionadvancesandapplications AT springerverlaglondonltd integratedimagingandvisiontechniquesforindustrialinspectionadvancesandapplications |