Monte Carlo modeling for electron microscopy and microanalysis:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York
Oxford University Press
1995
|
| Series: | Oxford series in optical and imaging sciences
9 |
| Subjects: | |
| Links: | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 |
| Item Description: | Includes bibliographical references and index 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? |
| Physical Description: | 1 Online-Ressource (viii, 216 pages) |
| ISBN: | 0195088743 0195358465 9780195088748 9780195358469 |
Staff View
MARC
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| id | DE-604.BV043153179 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:29:48Z |
| institution | BVB |
| isbn | 0195088743 0195358465 9780195088748 9780195358469 |
| language | English |
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| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (viii, 216 pages) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Oxford University Press |
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| series2 | Oxford series in optical and imaging sciences |
| spelling | Joy, David C. Verfasser aut Monte Carlo modeling for electron microscopy and microanalysis David C. Joy New York Oxford University Press 1995 1 Online-Ressource (viii, 216 pages) txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 9 Includes bibliographical references and index 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Computer simulation fast Electron probe microanalysis / Computer simulation fast Monte Carlo method fast Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Monte-Carlo-Simulation (DE-588)4240945-7 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Monte-Carlo-Simulation (DE-588)4240945-7 s 1\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 2\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Joy, David C. Monte Carlo modeling for electron microscopy and microanalysis Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Computer simulation fast Electron probe microanalysis / Computer simulation fast Monte Carlo method fast Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4240945-7 (DE-588)4151898-6 |
| title | Monte Carlo modeling for electron microscopy and microanalysis |
| title_auth | Monte Carlo modeling for electron microscopy and microanalysis |
| title_exact_search | Monte Carlo modeling for electron microscopy and microanalysis |
| title_full | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_fullStr | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_full_unstemmed | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_short | Monte Carlo modeling for electron microscopy and microanalysis |
| title_sort | monte carlo modeling for electron microscopy and microanalysis |
| topic | Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Computer simulation fast Electron probe microanalysis / Computer simulation fast Monte Carlo method fast Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy Electron microscopy / Computer simulation Electron probe microanalysis / Computer simulation Monte Carlo method Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Elektronenmikroskopie Monte-Carlo-Simulation Elektronenstrahlmikroanalyse |
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