Transmission electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1993
|
| Ausgabe: | Third Edition |
| Schriftenreihe: | Springer Series in Optical Sciences
36 |
| Schlagwörter: | |
| Links: | https://doi.org/10.1007/978-3-662-21556-2 |
| Beschreibung: | "Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analysed are the kinetical and dynamical theories of electron diffraction and their applications for crystal-structure determination and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. The third edition includes a brief discussionof Schottky emission guns, some clarification of minor details, and references to the recent literature |
| Umfang: | 1 Online-Ressource (XIV, 545 p) |
| ISBN: | 9783662215562 9783540568490 |
| DOI: | 10.1007/978-3-662-21556-2 |
Internformat
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| discipline | Physik |
| doi_str_mv | 10.1007/978-3-662-21556-2 |
| edition | Third Edition |
| format | Electronic eBook |
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| id | DE-604.BV042414635 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:10:31Z |
| institution | BVB |
| isbn | 9783662215562 9783540568490 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027850128 |
| oclc_num | 860150086 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIV, 545 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spellingShingle | Reimer, Ludwig 1928- Transmission electron microscopy physics of image formation and microanalysis Springer Series in Optical Sciences Physics Chemistry, Physical organic Pathology Cytology Engineering Solid State Physics Spectroscopy and Microscopy Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften Mikroanalyse (DE-588)4169804-6 gnd Kristallstruktur (DE-588)4136176-3 gnd Beugung (DE-588)4145094-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4136176-3 (DE-588)4145094-2 (DE-588)4014327-2 (DE-588)4125978-6 (DE-588)4045956-1 (DE-588)4215608-7 |
| title | Transmission electron microscopy physics of image formation and microanalysis |
| title_auth | Transmission electron microscopy physics of image formation and microanalysis |
| title_exact_search | Transmission electron microscopy physics of image formation and microanalysis |
| title_full | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Transmission electron microscopy |
| title_sort | transmission electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Physics Chemistry, Physical organic Pathology Cytology Engineering Solid State Physics Spectroscopy and Microscopy Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften Mikroanalyse (DE-588)4169804-6 gnd Kristallstruktur (DE-588)4136176-3 gnd Beugung (DE-588)4145094-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Physics Chemistry, Physical organic Pathology Cytology Engineering Solid State Physics Spectroscopy and Microscopy Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften Mikroanalyse Kristallstruktur Beugung Elektronenmikroskopie Elektron Physik Durchstrahlungselektronenmikroskopie |
| url | https://doi.org/10.1007/978-3-662-21556-2 |
| volume_link | (DE-604)BV000000237 |
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