Energy-Filtering Transmission Electron Microscopy:
Gespeichert in:
| Weitere beteiligte Personen: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1995
|
| Schriftenreihe: | Springer Series in Optical Sciences
71 |
| Schlagwörter: | |
| Links: | https://doi.org/10.1007/978-3-540-48995-5 |
| Beschreibung: | Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument |
| Umfang: | 1 Online-Ressource (XIII, 425 p) |
| ISBN: | 9783540489955 9783662140550 |
| DOI: | 10.1007/978-3-540-48995-5 |
Internformat
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV042413060 | ||
| 003 | DE-604 | ||
| 005 | 20220105 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150316s1995 xx o|||| 00||| eng d | ||
| 020 | |a 9783540489955 |c Online |9 978-3-540-48995-5 | ||
| 020 | |a 9783662140550 |c Print |9 978-3-662-14055-0 | ||
| 024 | 7 | |a 10.1007/978-3-540-48995-5 |2 doi | |
| 035 | |a (OCoLC)860218898 | ||
| 035 | |a (DE-599)BVBBV042413060 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 571.4 |2 23 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UH 5100 |0 (DE-625)145654: |2 rvk | ||
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Reimer, Ludwig |d 1928- |0 (DE-588)13230130X |4 edt | |
| 245 | 1 | 0 | |a Energy-Filtering Transmission Electron Microscopy |c Ludwig Reimer (ed.) |
| 264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1995 | |
| 300 | |a 1 Online-Ressource (XIII, 425 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Optical Sciences |v 71 | |
| 500 | |a Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Mineralogy | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Biophysics and Biological Physics | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Complexity | |
| 650 | 4 | |a Ingenieurwissenschaften | |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spektrale Filterung |0 (DE-588)4273436-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | 1 | |a Spektrale Filterung |0 (DE-588)4273436-8 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 3-540-58479-X |
| 830 | 0 | |a Springer Series in Optical Sciences |v 71 |w (DE-604)BV000000237 |9 71 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-540-48995-5 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA | ||
| 912 | |a ZDB-2-BAE | ||
| 940 | 1 | |q ZDB-2-PHA_Archive | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-027848553 | |
Datensatz im Suchindex
| DE-BY-TUM_katkey | 2062379 |
|---|---|
| _version_ | 1821931286304915456 |
| any_adam_object | |
| author2 | Reimer, Ludwig 1928- |
| author2_role | edt |
| author2_variant | l r lr |
| author_GND | (DE-588)13230130X |
| author_facet | Reimer, Ludwig 1928- |
| building | Verbundindex |
| bvnumber | BV042413060 |
| classification_rvk | UH 6300 UH 5100 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-2-BAE |
| ctrlnum | (OCoLC)860218898 (DE-599)BVBBV042413060 |
| dewey-full | 571.4 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 571 - Physiology & related subjects |
| dewey-raw | 571.4 |
| dewey-search | 571.4 |
| dewey-sort | 3571.4 |
| dewey-tens | 570 - Biology |
| discipline | Physik Biologie |
| doi_str_mv | 10.1007/978-3-540-48995-5 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03131nam a2200601zcb4500</leader><controlfield tag="001">BV042413060</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220105 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1995 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783540489955</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-540-48995-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783662140550</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-662-14055-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-540-48995-5</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)860218898</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042413060</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">571.4</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5100</subfield><subfield code="0">(DE-625)145654:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Reimer, Ludwig</subfield><subfield code="d">1928-</subfield><subfield code="0">(DE-588)13230130X</subfield><subfield code="4">edt</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Energy-Filtering Transmission Electron Microscopy</subfield><subfield code="c">Ludwig Reimer (ed.)</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIII, 425 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">71</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mineralogy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Biophysics and Biological Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Complexity</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektrale Filterung</subfield><subfield code="0">(DE-588)4273436-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Spektrale Filterung</subfield><subfield code="0">(DE-588)4273436-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">3-540-58479-X</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">71</subfield><subfield code="w">(DE-604)BV000000237</subfield><subfield code="9">71</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-540-48995-5</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027848553</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV042413060 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:10:28Z |
| institution | BVB |
| isbn | 9783540489955 9783662140550 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027848553 |
| oclc_num | 860218898 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIII, 425 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spellingShingle | Energy-Filtering Transmission Electron Microscopy Springer Series in Optical Sciences Physics Mineralogy Engineering Biophysics and Biological Physics Solid State Physics Spectroscopy and Microscopy Complexity Ingenieurwissenschaften Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Spektrale Filterung (DE-588)4273436-8 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4273436-8 (DE-588)4143413-4 |
| title | Energy-Filtering Transmission Electron Microscopy |
| title_auth | Energy-Filtering Transmission Electron Microscopy |
| title_exact_search | Energy-Filtering Transmission Electron Microscopy |
| title_full | Energy-Filtering Transmission Electron Microscopy Ludwig Reimer (ed.) |
| title_fullStr | Energy-Filtering Transmission Electron Microscopy Ludwig Reimer (ed.) |
| title_full_unstemmed | Energy-Filtering Transmission Electron Microscopy Ludwig Reimer (ed.) |
| title_short | Energy-Filtering Transmission Electron Microscopy |
| title_sort | energy filtering transmission electron microscopy |
| topic | Physics Mineralogy Engineering Biophysics and Biological Physics Solid State Physics Spectroscopy and Microscopy Complexity Ingenieurwissenschaften Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Spektrale Filterung (DE-588)4273436-8 gnd |
| topic_facet | Physics Mineralogy Engineering Biophysics and Biological Physics Solid State Physics Spectroscopy and Microscopy Complexity Ingenieurwissenschaften Durchstrahlungselektronenmikroskopie Spektrale Filterung Aufsatzsammlung |
| url | https://doi.org/10.1007/978-3-540-48995-5 |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig energyfilteringtransmissionelectronmicroscopy |