Scanning electron microscopy: physics of image formation and microanalysis
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1998
|
| Edition: | Second Completely Revised and Updated Edition |
| Series: | Springer Series in Optical Sciences
45 |
| Subjects: | |
| Links: | https://doi.org/10.1007/978-3-540-38967-5 |
| Item Description: | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information |
| Physical Description: | 1 Online-Ressource (XIV, 529 p) |
| ISBN: | 9783540389675 9783642083723 |
| DOI: | 10.1007/978-3-540-38967-5 |
Staff View
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV042412906 | ||
| 003 | DE-604 | ||
| 005 | 20220121 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150316s1998 xx o|||| 00||| eng d | ||
| 020 | |a 9783540389675 |c Online |9 978-3-540-38967-5 | ||
| 020 | |a 9783642083723 |c Print |9 978-3-642-08372-3 | ||
| 024 | 7 | |a 10.1007/978-3-540-38967-5 |2 doi | |
| 035 | |a (OCoLC)857995722 | ||
| 035 | |a (DE-599)BVBBV042412906 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 530.41 |2 23 | |
| 084 | |a UH 5100 |0 (DE-625)145654: |2 rvk | ||
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 084 | |a UH 5090 |0 (DE-625)145653: |2 rvk | ||
| 084 | |a PHY 000 |2 stub | ||
| 084 | |a PHY 135f |2 stub | ||
| 100 | 1 | |a Reimer, Ludwig |d 1928- |e Verfasser |0 (DE-588)13230130X |4 aut | |
| 245 | 1 | 0 | |a Scanning electron microscopy |b physics of image formation and microanalysis |c Ludwig Reimer |
| 250 | |a Second Completely Revised and Updated Edition | ||
| 264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1998 | |
| 300 | |a 1 Online-Ressource (XIV, 529 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Optical Sciences |v 45 | |
| 500 | |a Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Physics, general | |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 3-540-63976-4 |
| 830 | 0 | |a Springer Series in Optical Sciences |v 45 |w (DE-604)BV000000237 |9 45 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-540-38967-5 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA | ||
| 912 | |a ZDB-2-BAE | ||
| 940 | 1 | |q ZDB-2-PHA_Archive | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-027848399 | |
Record in the Search Index
| DE-BY-TUM_katkey | 2062225 |
|---|---|
| _version_ | 1821931284726808577 |
| any_adam_object | |
| author | Reimer, Ludwig 1928- |
| author_GND | (DE-588)13230130X |
| author_facet | Reimer, Ludwig 1928- |
| author_role | aut |
| author_sort | Reimer, Ludwig 1928- |
| author_variant | l r lr |
| building | Verbundindex |
| bvnumber | BV042412906 |
| classification_rvk | UH 5100 UH 6310 UH 5090 |
| classification_tum | PHY 000 PHY 135f |
| collection | ZDB-2-PHA ZDB-2-BAE |
| ctrlnum | (OCoLC)857995722 (DE-599)BVBBV042412906 |
| dewey-full | 530.41 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.41 |
| dewey-search | 530.41 |
| dewey-sort | 3530.41 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-540-38967-5 |
| edition | Second Completely Revised and Updated Edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02323nam a2200541zcb4500</leader><controlfield tag="001">BV042412906</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220121 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1998 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783540389675</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-540-38967-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783642083723</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-642-08372-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-540-38967-5</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)857995722</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042412906</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.41</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5100</subfield><subfield code="0">(DE-625)145654:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5090</subfield><subfield code="0">(DE-625)145653:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Reimer, Ludwig</subfield><subfield code="d">1928-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)13230130X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning electron microscopy</subfield><subfield code="b">physics of image formation and microanalysis</subfield><subfield code="c">Ludwig Reimer</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Second Completely Revised and Updated Edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIV, 529 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">45</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics, general</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">3-540-63976-4</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">45</subfield><subfield code="w">(DE-604)BV000000237</subfield><subfield code="9">45</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-540-38967-5</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027848399</subfield></datafield></record></collection> |
| id | DE-604.BV042412906 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:10:28Z |
| institution | BVB |
| isbn | 9783540389675 9783642083723 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027848399 |
| oclc_num | 857995722 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIV, 529 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spellingShingle | Reimer, Ludwig 1928- Scanning electron microscopy physics of image formation and microanalysis Springer Series in Optical Sciences Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | Scanning electron microscopy physics of image formation and microanalysis |
| title_auth | Scanning electron microscopy physics of image formation and microanalysis |
| title_exact_search | Scanning electron microscopy physics of image formation and microanalysis |
| title_full | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie |
| url | https://doi.org/10.1007/978-3-540-38967-5 |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig scanningelectronmicroscopyphysicsofimageformationandmicroanalysis |