New approaches to image processing based failure analysis of nano-scale ULSI devices:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Oxford, UK
William Andrew
2014
|
| Schriftenreihe: | Micro & nano technologies series
|
| Schlagwörter: | |
| Links: | http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10812561 http://www.gbv.de/dms/bowker/toc/9780323241434.pdf |
| Beschreibung: | Includes bibliographical references |
| Umfang: | 101 S. Ill, graph. Darst. |
| ISBN: | 9780323241434 |
Internformat
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Zalevsky, Zeev |
| author_facet | Zalevsky, Zeev |
| author_role | aut |
| author_sort | Zalevsky, Zeev |
| author_variant | z z zz |
| building | Verbundindex |
| bvnumber | BV042014771 |
| classification_rvk | ZN 4032 ZN 4952 |
| ctrlnum | (OCoLC)915537940 (DE-599)BVBBV042014771 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV042014771 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T17:00:07Z |
| institution | BVB |
| isbn | 9780323241434 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027456586 |
| oclc_num | 915537940 |
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| owner | DE-83 |
| owner_facet | DE-83 |
| physical | 101 S. Ill, graph. Darst. |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | William Andrew |
| record_format | marc |
| series2 | Micro & nano technologies series |
| spelling | Zalevsky, Zeev Verfasser aut New approaches to image processing based failure analysis of nano-scale ULSI devices Zeev Zalevsky, Pavel Livshits, Eran Gur Oxford, UK William Andrew 2014 101 S. Ill, graph. Darst. txt rdacontent n rdamedia nc rdacarrier Micro & nano technologies series Includes bibliographical references Bildverarbeitung (DE-588)4006684-8 gnd rswk-swf ULSI (DE-588)4226286-0 gnd rswk-swf Schadensanalyse (DE-588)4130826-8 gnd rswk-swf Bildverarbeitung (DE-588)4006684-8 s Schadensanalyse (DE-588)4130826-8 s ULSI (DE-588)4226286-0 s DE-604 Gur, Eran Sonstige oth Livshits, Pavel Sonstige oth http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10812561 DE-601 pdf/application http://www.gbv.de/dms/bowker/toc/9780323241434.pdf Inhaltsverzeichnis |
| spellingShingle | Zalevsky, Zeev New approaches to image processing based failure analysis of nano-scale ULSI devices Bildverarbeitung (DE-588)4006684-8 gnd ULSI (DE-588)4226286-0 gnd Schadensanalyse (DE-588)4130826-8 gnd |
| subject_GND | (DE-588)4006684-8 (DE-588)4226286-0 (DE-588)4130826-8 |
| title | New approaches to image processing based failure analysis of nano-scale ULSI devices |
| title_auth | New approaches to image processing based failure analysis of nano-scale ULSI devices |
| title_exact_search | New approaches to image processing based failure analysis of nano-scale ULSI devices |
| title_full | New approaches to image processing based failure analysis of nano-scale ULSI devices Zeev Zalevsky, Pavel Livshits, Eran Gur |
| title_fullStr | New approaches to image processing based failure analysis of nano-scale ULSI devices Zeev Zalevsky, Pavel Livshits, Eran Gur |
| title_full_unstemmed | New approaches to image processing based failure analysis of nano-scale ULSI devices Zeev Zalevsky, Pavel Livshits, Eran Gur |
| title_short | New approaches to image processing based failure analysis of nano-scale ULSI devices |
| title_sort | new approaches to image processing based failure analysis of nano scale ulsi devices |
| topic | Bildverarbeitung (DE-588)4006684-8 gnd ULSI (DE-588)4226286-0 gnd Schadensanalyse (DE-588)4130826-8 gnd |
| topic_facet | Bildverarbeitung ULSI Schadensanalyse |
| url | http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10812561 http://www.gbv.de/dms/bowker/toc/9780323241434.pdf |
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