Wafer-level testing and test during burn-in for integrated circuits:
Gespeichert in:
| Beteiligte Personen: | , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Boston [u.a.]
Artech House
2010
|
| Schriftenreihe: | Artech House integrated microsystems series
|
| Umfang: | XI, 198 S. Ill., graph. Darst. |
| ISBN: | 9781596939899 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV039733537 | ||
| 003 | DE-604 | ||
| 005 | 20120116 | ||
| 007 | t| | ||
| 008 | 111130s2010 xx ad|| |||| 00||| eng d | ||
| 020 | |a 9781596939899 |9 978-1-59693-989-9 | ||
| 035 | |a (OCoLC)449516460 | ||
| 035 | |a (DE-599)BVBBV039733537 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-898 | ||
| 082 | 0 | |a 621.381 | |
| 084 | |a ZN 4900 |0 (DE-625)157417: |2 rvk | ||
| 100 | 1 | |a Bahukudumbi, Sudarshan |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Wafer-level testing and test during burn-in for integrated circuits |c Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| 264 | 1 | |a Boston [u.a.] |b Artech House |c 2010 | |
| 300 | |a XI, 198 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Artech House integrated microsystems series | |
| 700 | 1 | |a Chakrabarty, Krishnendu |e Verfasser |4 aut | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-024581371 | |
Datensatz im Suchindex
| _version_ | 1818975761874288640 |
|---|---|
| any_adam_object | |
| author | Bahukudumbi, Sudarshan Chakrabarty, Krishnendu |
| author_facet | Bahukudumbi, Sudarshan Chakrabarty, Krishnendu |
| author_role | aut aut |
| author_sort | Bahukudumbi, Sudarshan |
| author_variant | s b sb k c kc |
| building | Verbundindex |
| bvnumber | BV039733537 |
| classification_rvk | ZN 4900 |
| ctrlnum | (OCoLC)449516460 (DE-599)BVBBV039733537 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00979nam a2200301 c 4500</leader><controlfield tag="001">BV039733537</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20120116 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">111130s2010 xx ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781596939899</subfield><subfield code="9">978-1-59693-989-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)449516460</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV039733537</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-898</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4900</subfield><subfield code="0">(DE-625)157417:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bahukudumbi, Sudarshan</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Wafer-level testing and test during burn-in for integrated circuits</subfield><subfield code="c">Sudarshan Bahukudumbi; Krishnendu Chakrabarty</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston [u.a.]</subfield><subfield code="b">Artech House</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 198 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Artech House integrated microsystems series</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chakrabarty, Krishnendu</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-024581371</subfield></datafield></record></collection> |
| id | DE-604.BV039733537 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T16:01:06Z |
| institution | BVB |
| isbn | 9781596939899 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024581371 |
| oclc_num | 449516460 |
| open_access_boolean | |
| owner | DE-898 DE-BY-UBR |
| owner_facet | DE-898 DE-BY-UBR |
| physical | XI, 198 S. Ill., graph. Darst. |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House integrated microsystems series |
| spelling | Bahukudumbi, Sudarshan Verfasser aut Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty Boston [u.a.] Artech House 2010 XI, 198 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Artech House integrated microsystems series Chakrabarty, Krishnendu Verfasser aut |
| spellingShingle | Bahukudumbi, Sudarshan Chakrabarty, Krishnendu Wafer-level testing and test during burn-in for integrated circuits |
| title | Wafer-level testing and test during burn-in for integrated circuits |
| title_auth | Wafer-level testing and test during burn-in for integrated circuits |
| title_exact_search | Wafer-level testing and test during burn-in for integrated circuits |
| title_full | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| title_fullStr | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| title_full_unstemmed | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| title_short | Wafer-level testing and test during burn-in for integrated circuits |
| title_sort | wafer level testing and test during burn in for integrated circuits |
| work_keys_str_mv | AT bahukudumbisudarshan waferleveltestingandtestduringburninforintegratedcircuits AT chakrabartykrishnendu waferleveltestingandtestduringburninforintegratedcircuits |