Verfügbarkeit: Lock-in thermography | Technische Universität München

Lock-in thermography: basics and use for evaluating electronic devices and materials

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Bibliographische Detailangaben
Beteiligte Personen:	Breitenstein, Otwin (VerfasserIn), Warta, Wilhelm (VerfasserIn), Langenkamp, Martin (VerfasserIn)
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	Berlin [u.a.] Springer 2010
Ausgabe:	2. ed.
Schriftenreihe:	Springer series in advanced microelectronics 10
Schlagwörter:	Prüftechnik Elektronisches Bauelement Infrarotthermographie
Links:	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018975136&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
Umfang:	X, 255 S. Ill., graph. Darst.
ISBN:	9783642024160

Internformat

MARC


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Datensatz im Suchindex

DE-BY-TUM_call_number	0002 MSR 055f 2011 A 4210(2)
DE-BY-TUM_katkey	1772516
DE-BY-TUM_location	00
DE-BY-TUM_media_number	040007295358
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adam_text	IMAGE 1 CONTENTS 1 INTRODUCTION . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 1 2 PHYSICAL AND TECHNICAL BASICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 7 2.1 IR THERMOGRAPHY BASICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 7 2.2 THE LOCK-IN PRINCIPLE AND ITS DIGITAL REALIZATION . . . . . . . . . . . . . . . .. . . . . . . 14 2.3 LOCK-IN THERMOGRAPHY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 22 2.4 TIMING STRATEGIES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 26 2.5 INFLUENCE OF NON-HARMONIC HEATING .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 33 2.6 NOISE ANALYSIS . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 38 2.7 CALIBRATION .. . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 42 2.8 HEAT DISSIPATION AND TRANSPORT MECHANISMS IN SOLAR CELLS . . . . .. . . . . . . 44 2.9 CARRIER DENSITY IMAGING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 51 3 EXPERIMENTAL TECHNIQUE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 61 3.1 DIFFERENT (LOCK-IN) THERMOGRAPHY REALIZATIONS . . . . . . . . . . . . . . . . .. . . . . . . 61 3.2 COMMERCIAL LOCK-IN THERMOGRAPHY SYSTEMS . . . . . . . . . . . . . . . . . . . .. . . . . . . 72 3.3 ILLUMINATION SYSTEMS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 80 3.4 SOLID IMMERSION LENSES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 85 3.5 REALIZATION OF CDI/ILM SYSTEMS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 91 3.5.1 ABSORPTION MODE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 91 3.5.2 EMISSION MODE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 94 3.5.3 LIFETIME CALIBRATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . 94 4 THEORY .. . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .101 4.1 INFLUENCE OF THE HEAT CONDUCTION TO THE SURROUNDING .. . . . . . . . . . .. . . . . . .101 4.2 TEMPERATURE DRIFT COMPENSATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .107 4.3 THERMAL WAVES OF POINT SOURCES .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .114 4.4 THERMAL WAVES OF EXTENDED SOURCES . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .118 4.5 THE QUANTITATIVE INTERPRETATION OF LOCK-IN THERMOGRAMS . . . . . . .. . . . . . .125 4.5.1 THE IMAGE INTEGRATION/PROPORTIONALITY METHOD . . . . . . . . . .. . . . . . .129 4.5.2 DECONVOLUTION OF LOCK-IN THERMOGRAMS .. . . . . . . . . . . . . . . .. . . . . . .137 IX IMAGE 2 X CONTENTS 5 MEASUREMENT STRATEGIES .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .149 5.1 WHICH SIGNAL SHOULD BE DISPLAYED? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .149 5.2 INFLUENCE OF THE LOCK-IN FREQUENCY .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .156 5.3 INFLUENCE OF THE IR EMISSIVITY .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .159 5.4 INFLUENCE OF THE PELTIER EFFECT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .168 6 TYPICAL APPLICATIONS . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .177 6.1 INTEGRATED CIRCUITS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .178 6.2 SOLAR CELLS . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .186 6.2.1 DARK LOCK-IN THERMOGRAPHY (DLIT) .. . . . . . . . . . . . . . . . . . . .. . . . . . .188 6.2.2 ILLUMINATED LOCK-IN THERMOGRAPHY (ILIT) .. . . . . . . . . . . . . .. . . . . . .201 6.2.3 SUMMARY OF SOLAR CELL APPLICATIONS . . . . . . . . . . . . . . . . . . . . .. . . . . . .212 6.3 FAILURE ANALYSIS OF SOLAR MODULES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .213 6.4 CDI/ILM ON SOLAR MATERIALS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .219 6.4.1 ANALYSIS OF MATERIAL EVOLUTION DURING PROCESSING . . . . . .. . . . . . .219 6.4.2 TEMPERATURE-DEPENDENT MEASUREMENTS . . . . . . . . . . . . . . . . . . .. . . . . . .219 6.4.3 TRAP DENSITY IMAGES FROM CDI/ILM . . . . . . . . . . . . . . . . . . . . . .. . . . . . .224 7 SUMMARY AND OUTLOOK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .229 REFERENCES .. . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .235 THERMAL AND IR PROPERTIES OF SELECTED MATERIALS .. . . . . . . . . . . . . . . . . . . . . .. . . . . . .245 LIST OF SYMBOLS . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .247 ABBREVIATIONS .. . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .251 INDEX . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .253
any_adam_object	1
author	Breitenstein, Otwin Warta, Wilhelm Langenkamp, Martin
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spellingShingle	Breitenstein, Otwin Warta, Wilhelm Langenkamp, Martin Lock-in thermography basics and use for evaluating electronic devices and materials Springer series in advanced microelectronics Prüftechnik (DE-588)4047610-8 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd Infrarotthermographie (DE-588)4242353-3 gnd
subject_GND	(DE-588)4047610-8 (DE-588)4014360-0 (DE-588)4242353-3
title	Lock-in thermography basics and use for evaluating electronic devices and materials
title_auth	Lock-in thermography basics and use for evaluating electronic devices and materials
title_exact_search	Lock-in thermography basics and use for evaluating electronic devices and materials
title_full	Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp
title_fullStr	Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp
title_full_unstemmed	Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp
title_short	Lock-in thermography
title_sort	lock in thermography basics and use for evaluating electronic devices and materials
title_sub	basics and use for evaluating electronic devices and materials
topic	Prüftechnik (DE-588)4047610-8 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd Infrarotthermographie (DE-588)4242353-3 gnd
topic_facet	Prüftechnik Elektronisches Bauelement Infrarotthermographie
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