Built-in Test for VLSI: pseudorandom techniques
Gespeichert in:
| Beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Nichtbestimmte Sprache |
| Veröffentlicht: |
New York, NY <<[u.a.]>>
Wiley
1987
|
| Schriftenreihe: | A Wiley-Interscience publication
|
| Umfang: | XIII, 354 S. |
| ISBN: | 0471624632 |
Internformat
MARC
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| 008 | 090924s1987 xx |||| 00||| und d | ||
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| 100 | 1 | |a Bardell, Paul H. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Built-in Test for VLSI |b pseudorandom techniques |c Paul H. Bardell ; William H. McAnney ; Jacob Savir |
| 264 | 1 | |a New York, NY <<[u.a.]>> |b Wiley |c 1987 | |
| 300 | |a XIII, 354 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a A Wiley-Interscience publication | |
| 700 | 1 | |a MacAnney, William H. |e Verfasser |4 aut | |
| 700 | 1 | |a Savir, Jacob |e Verfasser |4 aut | |
| 940 | 1 | |q TUB-nve | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-018076033 | |
Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Bardell, Paul H. MacAnney, William H. Savir, Jacob |
| author_facet | Bardell, Paul H. MacAnney, William H. Savir, Jacob |
| author_role | aut aut aut |
| author_sort | Bardell, Paul H. |
| author_variant | p h b ph phb w h m wh whm j s js |
| building | Verbundindex |
| bvnumber | BV024664989 |
| ctrlnum | (OCoLC)830694528 (DE-599)BVBBV024664989 |
| format | Book |
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| id | DE-604.BV024664989 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T13:50:22Z |
| institution | BVB |
| isbn | 0471624632 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018076033 |
| oclc_num | 830694528 |
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| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XIII, 354 S. |
| psigel | TUB-nve |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience publication |
| spelling | Bardell, Paul H. Verfasser aut Built-in Test for VLSI pseudorandom techniques Paul H. Bardell ; William H. McAnney ; Jacob Savir New York, NY <<[u.a.]>> Wiley 1987 XIII, 354 S. txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience publication MacAnney, William H. Verfasser aut Savir, Jacob Verfasser aut |
| spellingShingle | Bardell, Paul H. MacAnney, William H. Savir, Jacob Built-in Test for VLSI pseudorandom techniques |
| title | Built-in Test for VLSI pseudorandom techniques |
| title_auth | Built-in Test for VLSI pseudorandom techniques |
| title_exact_search | Built-in Test for VLSI pseudorandom techniques |
| title_full | Built-in Test for VLSI pseudorandom techniques Paul H. Bardell ; William H. McAnney ; Jacob Savir |
| title_fullStr | Built-in Test for VLSI pseudorandom techniques Paul H. Bardell ; William H. McAnney ; Jacob Savir |
| title_full_unstemmed | Built-in Test for VLSI pseudorandom techniques Paul H. Bardell ; William H. McAnney ; Jacob Savir |
| title_short | Built-in Test for VLSI |
| title_sort | built in test for vlsi pseudorandom techniques |
| title_sub | pseudorandom techniques |
| work_keys_str_mv | AT bardellpaulh builtintestforvlsipseudorandomtechniques AT macanneywilliamh builtintestforvlsipseudorandomtechniques AT savirjacob builtintestforvlsipseudorandomtechniques |