Quantitative strain analysis with image shearing speckle pattern interferometry (shearography):
Saved in:
Bibliographic Details
Main Author: Waldner, Stephan Peter (Author)
Format: Thesis/Dissertation Microform Book
Language:English
Published: 2000
Edition:[Mikrofiche-Ausg.]
Subjects:
Physical Description:XIV, 126 Bl. Ill., graph. Darst.