Symposium: held April 13 - 16, 1998, San Francisco, California, USA
Saved in:
Bibliographic Details
Corporate Author: Symposium Materials Reliability in Microelectronics San Francisco, Calif (Author)
Other Authors: Bravman, John C. (Editor)
Format: Conference Proceedings Book
Language:Undetermined
Published: Pittsburgh, Pa. Materials Research Soc. 1998
Series:Materials Research Society symposium proceedings 516 : Materials reliability in microelectronics ; 8
Materials Research Society symposium proceedings 516
Subjects:
Physical Description:XI, 365 S. Ill., graph. Darst.
ISBN:155899422X