Is distance dying at last?: Falling home bias in fixed effects models of patent citations
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Bibliographic Details
Main Authors: Griffith, Rachel (Author), Lee, Sokbae (Author), Van Reenen, John 1965- (Author)
Format: Book
Language:English
Published: Cambridge, Mass. National Bureau of Economic Research 2007
Series:Working paper series / National Bureau of Economic Research 13338
Links:http://papers.nber.org/papers/w13338.pdf
Item Description:Literaturverz. S. 22 - 25
Physical Description:47 S. graph. Darst. 22 cm