On line-testing for VLSI:
Gespeichert in:
| Weitere beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Boston ; Dordrecht ; London
Kluwer Acad. Publ.
1998
|
| Schlagwörter: | |
| Beschreibung: | Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998 |
| Umfang: | 159 S. graph. Darst. |
| ISBN: | 0792381327 |
Internformat
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| 264 | 1 | |a Boston ; Dordrecht ; London |b Kluwer Acad. Publ. |c 1998 | |
| 300 | |a 159 S. |b graph. Darst. | ||
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| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Electronic circuits -- Testing -- Data processing | |
| 650 | 4 | |a Online data processing | |
| 650 | 4 | |a Electronic circuit design | |
| 650 | 4 | |a Error-correcting codes (Information theory) | |
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Datensatz im Suchindex
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| author_facet | Nicolaidis, Michael Zorian, Yervant Pradan, Dhiraj K. |
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| callnumber-sort | TK 47867 O5 41998 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
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| dewey-search | 621.3815/028/7 21 |
| dewey-sort | 3621.3815 228 17 221 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
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| id | DE-604.BV023517565 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T13:21:39Z |
| institution | BVB |
| isbn | 0792381327 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016838003 |
| oclc_num | 632405152 |
| open_access_boolean | |
| owner | DE-521 |
| owner_facet | DE-521 |
| physical | 159 S. graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Kluwer Acad. Publ. |
| record_format | marc |
| spelling | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan Boston ; Dordrecht ; London Kluwer Acad. Publ. 1998 159 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998 Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI (DE-588)4117388-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content VLSI (DE-588)4117388-0 s Test (DE-588)4059549-3 s 1\p DE-604 Nicolaidis, Michael edt Zorian, Yervant edt Pradan, Dhiraj K. edt 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | On line-testing for VLSI Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4059549-3 (DE-588)4143413-4 |
| title | On line-testing for VLSI |
| title_auth | On line-testing for VLSI |
| title_exact_search | On line-testing for VLSI |
| title_full | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
| title_fullStr | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
| title_full_unstemmed | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
| title_short | On line-testing for VLSI |
| title_sort | on line testing for vlsi |
| topic | Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd |
| topic_facet | Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI Test Aufsatzsammlung |
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