Quantitative strain analysis with image shearing speckle pattern interferometry (shearography):
Saved in:
Bibliographic Details
Main Author: Waldner, Stephan Peter (Author)
Format: Microform Book
Language:English
Published: 2000
Edition:[Mikrofiche-Ausg.]
Subjects:
Item Description:Zürich, Techn. Hochsch., Diss., 2000. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x
Physical Description:XIV, 126 S. Ill., graph. Darst.
Order paper/chapter scan

Closed Stacks

Holdings details from Bibliotheksmagazin
Call Number: 0001 MD 18519 Floor plan
Copy 1 Available for loan On Shelf