Random testing of digital circuits: theory and applications
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
New York [u.a.]
Dekker
1998
|
| Schlagwörter: | |
| Umfang: | XIX, 475 S. graph. Darst. |
| ISBN: | 0824701828 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV012989945 | ||
| 003 | DE-604 | ||
| 005 | 20000720 | ||
| 007 | t| | ||
| 008 | 000215s1998 xx d||| |||| 00||| eng d | ||
| 020 | |a 0824701828 |9 0-8247-0182-8 | ||
| 035 | |a (OCoLC)38304292 | ||
| 035 | |a (DE-599)BVBBV012989945 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.3815 |2 21 | |
| 084 | |a ZN 4930 |0 (DE-625)157422: |2 rvk | ||
| 100 | 1 | |a David, René |d 1906-1990 |e Verfasser |0 (DE-588)124469973 |4 aut | |
| 245 | 1 | 0 | |a Random testing of digital circuits |b theory and applications |c René David |
| 264 | 1 | |a New York [u.a.] |b Dekker |c 1998 | |
| 300 | |a XIX, 475 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 0 | 7 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |D s |
| 689 | 0 | 1 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-008850527 | |
Datensatz im Suchindex
| _version_ | 1818955539999096832 |
|---|---|
| any_adam_object | |
| author | David, René 1906-1990 |
| author_GND | (DE-588)124469973 |
| author_facet | David, René 1906-1990 |
| author_role | aut |
| author_sort | David, René 1906-1990 |
| author_variant | r d rd |
| building | Verbundindex |
| bvnumber | BV012989945 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4930 |
| ctrlnum | (OCoLC)38304292 (DE-599)BVBBV012989945 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV012989945 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T10:39:41Z |
| institution | BVB |
| isbn | 0824701828 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008850527 |
| oclc_num | 38304292 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XIX, 475 S. graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Dekker |
| record_format | marc |
| spelling | David, René 1906-1990 Verfasser (DE-588)124469973 aut Random testing of digital circuits theory and applications René David New York [u.a.] Dekker 1998 XIX, 475 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Digital integrated circuits Testing Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Automatisches Prüfen (DE-588)4269925-3 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 s Automatisches Prüfen (DE-588)4269925-3 s DE-604 |
| spellingShingle | David, René 1906-1990 Random testing of digital circuits theory and applications Digital integrated circuits Testing Digitale integrierte Schaltung (DE-588)4113313-4 gnd Automatisches Prüfen (DE-588)4269925-3 gnd |
| subject_GND | (DE-588)4113313-4 (DE-588)4269925-3 |
| title | Random testing of digital circuits theory and applications |
| title_auth | Random testing of digital circuits theory and applications |
| title_exact_search | Random testing of digital circuits theory and applications |
| title_full | Random testing of digital circuits theory and applications René David |
| title_fullStr | Random testing of digital circuits theory and applications René David |
| title_full_unstemmed | Random testing of digital circuits theory and applications René David |
| title_short | Random testing of digital circuits |
| title_sort | random testing of digital circuits theory and applications |
| title_sub | theory and applications |
| topic | Digital integrated circuits Testing Digitale integrierte Schaltung (DE-588)4113313-4 gnd Automatisches Prüfen (DE-588)4269925-3 gnd |
| topic_facet | Digital integrated circuits Testing Digitale integrierte Schaltung Automatisches Prüfen |
| work_keys_str_mv | AT davidrene randomtestingofdigitalcircuitstheoryandapplications |