Run length analysis of Shewhart charts applied to drifting processes under an integrative SPC-EPC model:
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Bibliographic Details
Main Authors: Göb, Rainer (Author), Del Castillo, Enrique (Author), Dräger, Klaus (Author)
Format: Book
Language:German
Published: Würzburg Würzburg Research Group on Quality Control, Inst. für Angewandte Mathematik und Statistik 1998
Series:Economic quality control 79
Subjects:
Physical Description:29 Bl. graph. Darst.