Reflection electron microscopy and spectroscopy for surface analysis:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Cambridge [u.a.]
Cambridge Univ. Press
1996
|
| Ausgabe: | 1. publ. |
| Schlagwörter: | |
| Links: | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007271023&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| Umfang: | XIX, 436 S. Ill., graph. Darst. |
| ISBN: | 0521482666 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV010875295 | ||
| 003 | DE-604 | ||
| 005 | 19961216 | ||
| 007 | t| | ||
| 008 | 960730s1996 xx ad|| |||| 00||| eng d | ||
| 020 | |a 0521482666 |9 0-521-48266-6 | ||
| 035 | |a (OCoLC)33078848 | ||
| 035 | |a (DE-599)BVBBV010875295 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 |a DE-703 |a DE-91G |a DE-634 |a DE-83 |a DE-11 | ||
| 050 | 0 | |a TA417.23 | |
| 082 | 0 | |a 620/.44 |2 20 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a WC 3100 |0 (DE-625)148081: |2 rvk | ||
| 084 | |a CHE 264f |2 stub | ||
| 084 | |a WER 780f |2 stub | ||
| 084 | |a PHY 135f |2 stub | ||
| 100 | 1 | |a Wang, Zhong Lin |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Reflection electron microscopy and spectroscopy for surface analysis |c Zhong Lin Wang |
| 250 | |a 1. publ. | ||
| 264 | 1 | |a Cambridge [u.a.] |b Cambridge Univ. Press |c 1996 | |
| 300 | |a XIX, 436 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Fortran (langage de programmation) |2 ram | |
| 650 | 7 | |a Microscopia eletrônica |2 larpcal | |
| 650 | 7 | |a Surface (Technologie) - Analyse |2 ram | |
| 650 | 7 | |a Électrons - Diffraction |2 ram | |
| 650 | 4 | |a Materials |x Microscopy | |
| 650 | 4 | |a Reflection electron microscopy | |
| 650 | 4 | |a Surfaces (Technology) |x Analysis | |
| 650 | 0 | 7 | |a Reflexionselektronenmikroskopie |0 (DE-588)4295699-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Reflexionselektronenmikroskopie |0 (DE-588)4295699-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 856 | 4 | 2 | |m GBV Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007271023&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-007271023 | |
Datensatz im Suchindex
| DE-BY-TUM_call_number | 0702 WER 780f 96 B 984 |
|---|---|
| DE-BY-TUM_katkey | 777693 |
| DE-BY-TUM_location | 07 |
| DE-BY-TUM_media_number | 040070024229 |
| _version_ | 1821938801374658560 |
| adam_text | REFLECTION ELECTRON MICROSCOPY AND SPECTROSCOPY FOR SURFACE ANALYSIS
ZHONG LIN WANG GEORGIA INSTITUTE OF TECHNOLOGY ATLANTA, GEORGIA, USA
CAMBRIDGE UNIVERSITY PRESS CONTENTS PREFACE PAGE XIII SYMBOLS AND
DEFINITIONS XIV 0 INTRODUCTION 1 0.1 HISTORICAL BACKGROUND 4 0.2 THE
SCOPE OF THE BOOK 6 KINEMATICAL ELECTRON DIFFRACTION 9 .1 ELECTRON
WAVELENGTH 9 .2 PLANE WAVE REPRESENTATION OF AN INCIDENT ELECTRON 10 1.3
THE BORN APPROXIMATION AND SINGLE-ATOM SCATTERING 11 1.4 THE FOURIER
TRANSFORM 12 1.5 THE SCATTERING FACTOR AND THE CHARGE DENSITY FUNCTION
13 1.6 SINGLE-SCATTERING THEORY 15 1.7 RECIPROCAL SPACE AND THE
RECIPROCAL-LATTICE VECTOR 19 1.8 BRAGG S LAW AND THE EWALD SPHERE 20 1.9
ABBE S IMAGING THEORY 23 1.10 THE PHASE OBJECT APPROXIMATION 26 1.11
ABERRATION AND THE CONTRAST TRANSFER FUNCTION 27 PART A DIFFRACTION OF
REFLECTED ELECTRONS 29 2 REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION 3 1
2.1 THE GEOMETRY OF RHEED 31 2.2 SURFACE CRYSTALLOGRAPHY 35 2.2.1
SURFACE RECONSTRUCTION 36 2.2.2 TWO-DIMENSIONAL RECIPROCAL SPACE 40 2.3
STREAKS AND LAUE RINGS IN RHEED 41 2.4 DETERMINATION OF SURFACE
STRUCTURES 42 2.5 RHEED OSCILLATION AND ITS APPLICATION IN MBE CRYSTAL
GROWTH 46 2.6 THE KINEMATICAL DIFFRACTION THEORY OF RHEED 51 2.6.1
PERFECTLY ORDERED SURFACES 51 2.6.2 COMPLETELY DISORDERED SURFACES 52
2.6.3 SURFACES WITH ISLANDS 52 2.6.4 STEPPED SURFACES 53 2.6.5 SURFACES
WITH RANDOMLY DISTRIBUTED COVERAGE 54 2.7 KIKUCHI PATTERNS IN RHEED 55
CONTENTS 3 DYNAMICAL THEORIES OF RHEED 60 3.1 THE BLOCH WAVE THEORY 62
3.2 PARALLEL-TO-SURFACE MULTISLICE THEORIES I 68 3.3 PARALLEL-TO-SURFACE
MULTISLICE THEORIES II 73 3.4 PERPENDICULAR-TO-SURFACE MULTISLICE THEORY
78 3.4.1 MULTISLICE SOLUTION OF THE SCHRODINGER EQUATION FOR
TRANSMISSION ELECTRON DIFFRACTION 80 3.4.2 APPLICATIONS IN RHEED
CALCULATIONS 82 3.5 DIFFRACTION OF DISORDERED AND STEPPED SURFACES 85
3.5.1 A PERTURBATION THEORY 85 3.5.2 STEPPED SURFACES 87 4 RESONANCE
REFLECTIONS IN RHEED 89 4.1 THE PHENOMENON 89 4.2 THE RESONANCE PARABOLA
AND THE RESONANCE CONDITION 93 4.3 THE WIDTH OF THE RESONANCE PARABOLA
95 4.4 THE KIKUCHI ENVELOPE 99 4.5 DYNAMICAL CALCULATIONS OF RESONANCE
SCATTERING 102 4.5.1 LOW-INCIDENCE-ANGLE RESONANCE 104 4.5.2
HIGH-INCIDENCE-ANGLE RESONANCE 107 4.5.3 RESONANCE AT A STEPPED SURFACE
109 4.5.4 A STEADY STATE WAVE AT A SURFACE 116 4.6 THE EFFECT OF VALENCE
EXCITATION IN RESONANCE REFLECTION 118 4.6.1 A SIMPLIFIED THEORY 118
4.6.2 THE EFFECT ON SURFACE RESONANCE 120 4.7 ENHANCEMENT OF INELASTIC
SCATTERING SIGNALS UNDER THE RESONANCE CONDITION 126 PART B IMAGING OF
REFLECTED ELECTRONS 129 5 IMAGING SURFACES IN TEM 13 1 5. 1 TECHNIQUES
FOR STUDYING SURFACES IN TEM 131 5.1.1 IMAGING USING SURFACE-LAYER
REFLECTIONS 131 5.1.2 SURFACE PROFILE IMAGING 134 5.1.3 REM OF BULK
CRYSTAL SURFACES 134 5.2 SURFACE PREPARATION TECHNIQUES 137 5.2.1
NATURAL OR AS-GROWN SURFACES 138 5.2.2 RE-CRYSTALLIZATION FROM MELTING
139 5.2.3 ANNEALING POLISHED SURFACES 139 5.2.4 CLEAVING BULK CRYSTALS
140 5.3 EXPERIMENTAL TECHNIQUES OF REM 141 5.3.1 MOUNTING SPECIMENS 141
5.3.2 MICROSCOPE PRE-ALIGNMENT 142 5.3.3 FORMING REM IMAGES 143 5.3.4
DIFFRACTION CONDITIONS FOR REM IMAGING 145 5.3.5 IMAGE RECORDING
TECHNIQUES 148 CONTENTS 5.4 FORESHORTENING EFFECTS 149 5.5 SURFACE
REFRACTION EFFECTS 151 5.6 MIRROR IMAGES IN REM 155 5.7 THE SURFACE
MIS-CUT ANGLE AND STEP HEIGHT 156 5.8 DETERMINING SURFACE ORIENTATIONS
160 5.9 DETERMINING STEP DIRECTIONS 161 6 CONTRAST MECHANISMS OF
REFLECTED ELECTRON IMAGING 1 66 6.1 PHASE CONTRAST 166 6.2 DIFFRACTION
CONTRAST . 171 6.3 SPATIAL INCOHERENCE IN REM IMAGING 177 6.4 SOURCE
COHERENCE AND SURFACE SENSITIVITY 180 6.5 THE EFFECT OF ENERGY FILTERING
182 6.6 DETERMINING THE NATURE OF SURFACE STEPS AND DISLOCATIONS 184
6.6.1 STEP HEIGHT 184 6.6.2 DOWN AND UP STEPS 186 6.7 REM IMAGE
RESOLUTION 186 6.8 HIGH-RESOLUTION REM AND FOURIER IMAGING 189 6.8.1
IMAGING A RECONSTRUCTED LAYER 189 6.8.2 FOURIER IMAGES 190 6.9 DEPTH OF
FIELD AND DEPTH OF FOCUS 193 6.10 DOUBLE IMAGES OF SURFACE STEPS 194
6.11 SURFACE CONTAMINATION 198 7 APPLICATIONS OF UHV REM 199 7.1 UHV
MICROSCOPES AND SPECIMEN CLEANING 199 7.2 IN SITU RECONSTRUCTION ON
CLEAN SURFACES 201 7.3 SURFACE ATOM DEPOSITION AND NUCLEATION PROCESSES
203 7.4 SURFACE-GAS REACTIONS 206 7.5 SURFACE ELECTROMIGRATION 207 7.6
SURFACE ION BOMBARDMENT 209 7.7 SURFACE ACTIVATION ENERGY 210 8
APPLICATIONS OF NON-UHV REM 21 1 8.1 STEPS AND DISLOCATIONS ON METAL
SURFACES 211 8.2 STEPS ON SEMICONDUCTOR SURFACES 211 8.3 CERAMICS
SURFACES 213 8.4 IN SITU DYNAMIC PROCESSES ON CERAMICS SURFACES 220 8.5
SURFACE ATOMIC TERMINATION AND RADIATION DAMAGE 228 8.6 RECONSTRUCTION
OF CERAMIC SURFACES 232 8.7 IMAGING PLANAR DEFECTS 232 8.8 AS-GROWN AND
POLISHED SURFACES 235 PART C INELASTIC SCATTERING AND SPECTROMETRY OF
REFLECTED ELECTRONS 241 9 PHONON SCATTERING IN RHEED 243 9.1 INELASTIC
EXCITATIONS IN CRYSTALS 243 CONTENTS 9.2 9.2.1 9.2.2 9.2.3 9.3 9.4 9.5
9.6 9.6.1 9.6.2 9.6.3 9.6.4 10 10.1 10.2 10.3 10.3 10.3 10.4 10.5 10.6
10.6 10.6 10.6 1 2 1 2 3 10.6.4 10.7 10.7 10.7 10.8 10.9 10.9 10.9 10.9
11 1 1 1 11.1 11.2 11.3 11.4 11.5 11.6 11.7 11.8 11.9 1 2 1 2 3 11.10
11.1 1 PHONON EXCITATION 246 PHONONS 246 THE EFFECT OF ATOMIC VIBRATIONS
ON THE CRYSTAL POTENTIAL 248 ELECTRON-PHONON INTERACTIONS 249
THE FROZEN LATTICE MODEL 251 CALCULATION OF THE DEBYE-WALLER FACTOR 253
KINEMATICAL TDS IN RHEED 254 DYNAMICAL TDS IN RHEED 257 THE RECIPROCITY
THEOREM 259 THE FOURIER TRANSFORM OF GREEN S FUNCTION 261 GREEN S
FUNCTION THEORY 262 A MODIFIED PARALLEL-TO-SURFACE MULTISLICE THEORY 267
VALENCE EXCITATION IN RHEED 270 EELS SPECTRA OF BULK CRYSTAL SURFACES
270 THE DIELECTRIC RESPONSE THEORY OF VALENCE EXCITATIONS 272 INTERFACE
AND SURFACE EXCITATIONS 275 CLASSICAL ENERGY-LOSS THEORY 275
LOCALIZATION EFFECTS IN SURFACE EXCITATION 279 THE AVERAGE NUMBER OF
PLASMON EXCITATIONS IN RHEED 282 EXCITATION OF A SANDWICH LAYER 283 THE
DIELECTRIC RESPONSE THEORY WITH RELATIVISTIC CORRECTION 286 MAXWELL S
EQUATIONS 286 VALENCE EXCITATION NEAR AN INTERFACE 287 THE TRANSVERSE
FORCE ON AN INCIDENT ELECTRON 291 CALCULATION OF REELS SPECTRA 292 THE
QUANTUM THEORY OF VALENCE EXCITATION 294 THE QUANTUM MECHANICAL BASIS OF
THE CLASSICAL THEORY 295 THE DENSITY OPERATOR AND DIELECTRIC RESPONSE
THEORY 298 DETERMINATION OF SURFACE PHASES 299 MULTIPLE-SCATTERING
EFFECTS 303 POISSON S DISTRIBUTION LAW 304 MEASUREMENT OF ELECTRON
PENETRATION DEPTH 306 MEASUREMENT OF ELECTRON MEAN TRAVELING DISTANCE
ALONG A SURFACE 309 ATOMIC INNER SHELL EXCITATIONS IN RHEED 311
EXCITATION OF ATOMIC INNER SHELL ELECTRONS 311 ATOMIC INNER SHELL
EXCITATION IN REFLECTION MODE 312 SURFACE ELNES 314 SURFACE EXELFS 316
SURFACE CHEMICAL MICROANALYSIS 319 THE EFFECT OF STRONG BRAGG BEAMS 324
RESONANCE AND CHANNELING EFFECTS 326 EFFECTIVE IONIZATION CROSS-SECTIONS
328 IMPURITY SEGREGATION AT SURFACES 330 OXYGEN ADSORPTION ON SURFACES
331 REELS IN MBE 334 CONTENTS 12 NOVEL TECHNIQUES ASSOCIATED WITH
REFLECTION ELECTRON IMAGING 337 12.1 SCANNING REFLECTION ELECTRON
MICROSCOPY 337 12.1.1 IMAGING SURFACE STEPS 337 12.1.2 IMAGING
DISLOCATIONS 341 12.2 SECONDARY ELECTRON IMAGING OF SURFACES 341 12.3
EDS IN RHEED GEOMETRY 346 12.4 ELECTRON HOLOGRAPHY OF SURFACES 346
12.4.1 PRINCIPLES AND THEORY 347 12.4.2 SURFACE HOLOGRAPHY 349 12.5 REM
WITH STM 352 12.5.1 ATOMIC-RESOLUTION SURFACE IMAGING 353 12.5.2
ARTIFACTS IN STM IMAGING 354 12.6 TIME-RESOLVED REM AND REM WITH PEEM
355 12.7 TOTAL-REFLECTION X-RAY SPECTROSCOPY IN RHEED 356 12.8 SURFACE
WAVE EXCITATION AUGER ELECTRON SPECTROSCOPY 361 12.9 LEEDANDLEEM 363
APPENDIX A PHYSICAL CONSTANTS, ELECTRON WAVELENGTHS AND WAVE NUMBERS 367
APPENDIX B THE CRYSTAL INNER POTENTIAL AND ELECTRON SCATTERING FACTOR
369 APPENDIX C. 1 CRYSTALLOGRAPHIC STRUCTURE SYSTEMS 374 APPENDIX C.2 A
FORTRAN PROGRAM FOR CALCULATING CRYSTALLOGRAPHIC DATA 378 APPENDIX D
ELECTRON DIFFRACTION PATTERNS OF SEVERAL TYPES OF CRYSTAL STRUCTURES 382
APPENDIX E.I A FORTRAN PROGRAM FOR SINGLE-LOSS SPECTRA OF A THIN CRYSTAL
SLAB IN TEM 386 APPENDIX E.2 A FORTRAN PROGRAM FOR SINGLE-LOSS REELS
SPECTRA IN RHEED 390 APPENDIX E.3 A FORTRAN PROGRAM FOR SINGLE-LOSS
SPECTRA OF PARALLEL-TO-SURFACE INCIDENT BEAMS 393 APPENDIX E.4 A
FORTRAN PROGRAM FOR SINGLE-LOSS SPECTRA OF INTERFACE EXCITATION IN TEM
398 APPENDIX F A BIBLIOGRAPHY OF REM, SREM AND REELS 403 REFERENCES 419
MATERIALS INDEX 431 SUBJECT INDEX 433
|
| any_adam_object | 1 |
| author | Wang, Zhong Lin |
| author_facet | Wang, Zhong Lin |
| author_role | aut |
| author_sort | Wang, Zhong Lin |
| author_variant | z l w zl zlw |
| building | Verbundindex |
| bvnumber | BV010875295 |
| callnumber-first | T - Technology |
| callnumber-label | TA417 |
| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UH 6300 WC 3100 |
| classification_tum | CHE 264f WER 780f PHY 135f |
| ctrlnum | (OCoLC)33078848 (DE-599)BVBBV010875295 |
| dewey-full | 620/.44 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620/.44 |
| dewey-search | 620/.44 |
| dewey-sort | 3620 244 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Biologie Werkstoffwissenschaften / Fertigungstechnik |
| edition | 1. publ. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01820nam a2200481 c 4500</leader><controlfield tag="001">BV010875295</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19961216 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">960730s1996 xx ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0521482666</subfield><subfield code="9">0-521-48266-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)33078848</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV010875295</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA417.23</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620/.44</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WC 3100</subfield><subfield code="0">(DE-625)148081:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">CHE 264f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WER 780f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wang, Zhong Lin</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reflection electron microscopy and spectroscopy for surface analysis</subfield><subfield code="c">Zhong Lin Wang</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. publ.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge [u.a.]</subfield><subfield code="b">Cambridge Univ. Press</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIX, 436 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Fortran (langage de programmation)</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopia eletrônica</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Surface (Technologie) - Analyse</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Électrons - Diffraction</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield><subfield code="x">Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reflection electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Technology)</subfield><subfield code="x">Analysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Reflexionselektronenmikroskopie</subfield><subfield code="0">(DE-588)4295699-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Reflexionselektronenmikroskopie</subfield><subfield code="0">(DE-588)4295699-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">GBV Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007271023&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007271023</subfield></datafield></record></collection> |
| id | DE-604.BV010875295 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T10:02:21Z |
| institution | BVB |
| isbn | 0521482666 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007271023 |
| oclc_num | 33078848 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-703 DE-91G DE-BY-TUM DE-634 DE-83 DE-11 |
| owner_facet | DE-355 DE-BY-UBR DE-703 DE-91G DE-BY-TUM DE-634 DE-83 DE-11 |
| physical | XIX, 436 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Cambridge Univ. Press |
| record_format | marc |
| spellingShingle | Wang, Zhong Lin Reflection electron microscopy and spectroscopy for surface analysis Fortran (langage de programmation) ram Microscopia eletrônica larpcal Surface (Technologie) - Analyse ram Électrons - Diffraction ram Materials Microscopy Reflection electron microscopy Surfaces (Technology) Analysis Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd |
| subject_GND | (DE-588)4295699-7 |
| title | Reflection electron microscopy and spectroscopy for surface analysis |
| title_auth | Reflection electron microscopy and spectroscopy for surface analysis |
| title_exact_search | Reflection electron microscopy and spectroscopy for surface analysis |
| title_full | Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang |
| title_fullStr | Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang |
| title_full_unstemmed | Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang |
| title_short | Reflection electron microscopy and spectroscopy for surface analysis |
| title_sort | reflection electron microscopy and spectroscopy for surface analysis |
| topic | Fortran (langage de programmation) ram Microscopia eletrônica larpcal Surface (Technologie) - Analyse ram Électrons - Diffraction ram Materials Microscopy Reflection electron microscopy Surfaces (Technology) Analysis Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd |
| topic_facet | Fortran (langage de programmation) Microscopia eletrônica Surface (Technologie) - Analyse Électrons - Diffraction Materials Microscopy Reflection electron microscopy Surfaces (Technology) Analysis Reflexionselektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007271023&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT wangzhonglin reflectionelectronmicroscopyandspectroscopyforsurfaceanalysis |
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