Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
London u.a.
Acad. Press
1993
|
| Schriftenreihe: | Techniques of physics
14 |
| Schlagwörter: | |
| Zusammenfassung: | There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique |
| Abstract: | Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors |
| Umfang: | X, 220 S. graph. Darst. |
| ISBN: | 0125507704 |
Internformat
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| 264 | 1 | |a London u.a. |b Acad. Press |c 1993 | |
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| 490 | 1 | |a Techniques of physics |v 14 | |
| 520 | 3 | |a Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors | |
| 520 | |a There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering | ||
| 520 | |a Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique | ||
| 650 | 4 | |a Semiconductors |x Testing |x Optical methods | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV009931118 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T09:44:42Z |
| institution | BVB |
| isbn | 0125507704 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006578920 |
| oclc_num | 29540358 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-634 |
| owner_facet | DE-91 DE-BY-TUM DE-634 |
| physical | X, 220 S. graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Acad. Press |
| record_format | marc |
| series | Techniques of physics |
| series2 | Techniques of physics |
| spellingShingle | Perkowitz, Sidney Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Techniques of physics Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4056138-0 |
| title | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_auth | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_exact_search | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_full | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_fullStr | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_full_unstemmed | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_short | Optical characterization of semiconductors |
| title_sort | optical characterization of semiconductors infrared raman and photoluminescence spectroscopy |
| title_sub | infrared, Raman, and photoluminescence spectroscopy |
| topic | Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| topic_facet | Semiconductors Testing Optical methods Halbleiter Spektroskopie |
| volume_link | (DE-604)BV001890126 |
| work_keys_str_mv | AT perkowitzsidney opticalcharacterizationofsemiconductorsinfraredramanandphotoluminescencespectroscopy |
Bibliotheksmagazin
| Signatur: | 0001 94 A 4119 |
|---|---|
| Exemplar 1 | Ausleihbar Am Standort |