Acceleration of RAM-tests with associative pattern recognition methods:
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Bibliographic Details
Main Authors: Tavangarian, Djamshid 1945-2022 (Author), Elm, Christian (Author)
Format: Book
Language:English
Published: Hagen Fernuniv. 1991
Series:Informatik-Berichte 112
Physical Description:15 Bl. graph. Darst.