Atom probe microanalysis: principles and applications to materials problems
Gespeichert in:
| Beteiligte Personen: | , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Pittsburgh, Pa.
Materials Research Society
1989
|
| Schlagwörter: | |
| Umfang: | XIV, 278 S. Ill., graph. Darst. |
| ISBN: | 0931837995 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV004407369 | ||
| 003 | DE-604 | ||
| 005 | 20010306 | ||
| 007 | t| | ||
| 008 | 910711s1989 xx ad|| |||| 00||| eng d | ||
| 020 | |a 0931837995 |9 0-931837-99-5 | ||
| 035 | |a (OCoLC)20294658 | ||
| 035 | |a (DE-599)BVBBV004407369 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-355 | ||
| 050 | 0 | |a QD906.7.E37 | |
| 082 | 0 | |a 620.1/1299 |2 20 | |
| 084 | |a UH 6330 |0 (DE-625)145763: |2 rvk | ||
| 100 | 1 | |a Miller, Michael K. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Atom probe microanalysis |b principles and applications to materials problems |c M. K. Miller ; G. D. W. Smith |
| 264 | 1 | |a Pittsburgh, Pa. |b Materials Research Society |c 1989 | |
| 300 | |a XIV, 278 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Atom-probe field ion microscopy | |
| 650 | 4 | |a Crystallography | |
| 650 | 0 | 7 | |a Feldionenmikroskopie |0 (DE-588)4153929-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Atom |0 (DE-588)4003412-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Atom |0 (DE-588)4003412-4 |D s |
| 689 | 0 | 1 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
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| 689 | 1 | 0 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
| 689 | 1 | 1 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Feldionenmikroskopie |0 (DE-588)4153929-1 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Smith, George D. |e Verfasser |4 aut | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-002735000 | |
Datensatz im Suchindex
| _version_ | 1818946614532767744 |
|---|---|
| any_adam_object | |
| author | Miller, Michael K. Smith, George D. |
| author_facet | Miller, Michael K. Smith, George D. |
| author_role | aut aut |
| author_sort | Miller, Michael K. |
| author_variant | m k m mk mkm g d s gd gds |
| building | Verbundindex |
| bvnumber | BV004407369 |
| callnumber-first | Q - Science |
| callnumber-label | QD906 |
| callnumber-raw | QD906.7.E37 |
| callnumber-search | QD906.7.E37 |
| callnumber-sort | QD 3906.7 E37 |
| callnumber-subject | QD - Chemistry |
| classification_rvk | UH 6330 |
| ctrlnum | (OCoLC)20294658 (DE-599)BVBBV004407369 |
| dewey-full | 620.1/1299 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1299 |
| dewey-search | 620.1/1299 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV004407369 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T08:17:49Z |
| institution | BVB |
| isbn | 0931837995 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002735000 |
| oclc_num | 20294658 |
| open_access_boolean | |
| owner | DE-29T DE-355 DE-BY-UBR |
| owner_facet | DE-29T DE-355 DE-BY-UBR |
| physical | XIV, 278 S. Ill., graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Materials Research Society |
| record_format | marc |
| spelling | Miller, Michael K. Verfasser aut Atom probe microanalysis principles and applications to materials problems M. K. Miller ; G. D. W. Smith Pittsburgh, Pa. Materials Research Society 1989 XIV, 278 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Atom-probe field ion microscopy Crystallography Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Atom (DE-588)4003412-4 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Atom (DE-588)4003412-4 s Mikroanalyse (DE-588)4169804-6 s DE-604 Werkstoff (DE-588)4065579-9 s Feldionenmikroskopie (DE-588)4153929-1 s Smith, George D. Verfasser aut |
| spellingShingle | Miller, Michael K. Smith, George D. Atom probe microanalysis principles and applications to materials problems Atom-probe field ion microscopy Crystallography Feldionenmikroskopie (DE-588)4153929-1 gnd Atom (DE-588)4003412-4 gnd Werkstoff (DE-588)4065579-9 gnd Mikroanalyse (DE-588)4169804-6 gnd |
| subject_GND | (DE-588)4153929-1 (DE-588)4003412-4 (DE-588)4065579-9 (DE-588)4169804-6 |
| title | Atom probe microanalysis principles and applications to materials problems |
| title_auth | Atom probe microanalysis principles and applications to materials problems |
| title_exact_search | Atom probe microanalysis principles and applications to materials problems |
| title_full | Atom probe microanalysis principles and applications to materials problems M. K. Miller ; G. D. W. Smith |
| title_fullStr | Atom probe microanalysis principles and applications to materials problems M. K. Miller ; G. D. W. Smith |
| title_full_unstemmed | Atom probe microanalysis principles and applications to materials problems M. K. Miller ; G. D. W. Smith |
| title_short | Atom probe microanalysis |
| title_sort | atom probe microanalysis principles and applications to materials problems |
| title_sub | principles and applications to materials problems |
| topic | Atom-probe field ion microscopy Crystallography Feldionenmikroskopie (DE-588)4153929-1 gnd Atom (DE-588)4003412-4 gnd Werkstoff (DE-588)4065579-9 gnd Mikroanalyse (DE-588)4169804-6 gnd |
| topic_facet | Atom-probe field ion microscopy Crystallography Feldionenmikroskopie Atom Werkstoff Mikroanalyse |
| work_keys_str_mv | AT millermichaelk atomprobemicroanalysisprinciplesandapplicationstomaterialsproblems AT smithgeorged atomprobemicroanalysisprinciplesandapplicationstomaterialsproblems |