Röntgenographische Strukturbestimmung mit dem Picker-Einkristall-Diffraktometer bei tiefen Temperaturen:
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Bibliographic Details
Main Author: Schulz, Friedrich W. (Author)
Format: Thesis/Dissertation Book
Language:German
Published: 1979
Subjects:
Physical Description:75 S. Ill.
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Holdings details from Bibliotheksmagazin
Call Number: 0001 DA 79 2291 Floor plan
Copy 1 Available for loan On Shelf