Search Results - Li, Yan 1977-

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    Robust design of DRAM core circuits: yield estimation and analysis by a statistical design approach
    by Li, Yan 1977-

    Published 2010
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    Thesis/Dissertation Book


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  2. 2
    Cover Image

    Robust design of DRAM core circuits: yield estimation and analysis by a statistical design approach
    by Li, Yan 1977-

    Published 2010
    Read online (freely available)
    Thesis/Dissertation Electronic eBook


    Saved in:

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