Search Results - Langenkamp, Martin

Lock-in thermography: basics and use for functional diagnostics of electronic components

by Breitenstein, Otwin, Langenkamp, Martin

Table of Contents

Lock-in thermography: basics and use for evaluating electronic devices and materials

by Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin

Table of Contents

Kapazitätsspektroskopie ausgedehnter Defekte in plastisch verformtem Silizium

by Langenkamp, Martin

Table of Contents
Order via interlibrary loan

Lock-in thermography: basics and use for evaluating electronic devices and materials

by Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin

Order via interlibrary loan

Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components

by Breitenstein, Otwin, Langenkamp, Martin

Order via interlibrary loan