Search Results - Breitenstein, Otwin
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1Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and MaterialsPublished 2018Call Number: Loading…Read online
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2Lock-in thermography: basics and use for evaluating electronic devices and materialsPublished 2010Call Number: Loading…Table of Contents
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3Lock-in thermography: basics and use for functional diagnostics of electronic componentsPublished 2003Call Number: Loading…Table of Contents
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4Lock-in thermography: basics and use for evaluating electronic devices and materialsPublished 2010Call Number: Loading…Order via interlibrary loan
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5Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic ComponentsPublished 2003Call Number: Loading…Order via interlibrary loan
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6Lock-in thermography: basics and use for evaluating electronic devices and materialsPublished 2018Call Number: Loading…Order via interlibrary loan
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7Entwicklung und Einsatz der rasterelektronenmikroskopischen Transient- spektroskopie (Scanning-DLTS) zur Untersuchung von Punktdefekt-Inhomo- genitäten in HalbleiternPublished 1992Call Number: Loading…Order via interlibrary loan
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8Einsatz und Erweiterung der Deep Level Transient Spectroscopy (DLTS) bei der Untersuchung von Faktoren, die die Effizienz von GaP:N-Lumineszenzdioden beeinflussenPublished 1980Call Number: Loading…Order via interlibrary loan
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